A “worst case” methodology for obtaining a rough but rapid indication of the societal risk from a major accident hazard installation

2002 ◽  
Vol 92 (3) ◽  
pp. 223-237 ◽  
Author(s):  
I Hirst
2019 ◽  
Vol 11 (01) ◽  
pp. 1930001 ◽  
Author(s):  
Peter Grünwald ◽  
Teemu Roos

This is an up-to-date introduction to and overview of the Minimum Description Length (MDL) Principle, a theory of inductive inference that can be applied to general problems in statistics, machine learning and pattern recognition. While MDL was originally based on data compression ideas, this introduction can be read without any knowledge thereof. It takes into account all major developments since 2007, the last time an extensive overview was written. These include new methods for model selection and averaging and hypothesis testing, as well as the first completely general definition of MDL estimators. Incorporating these developments, MDL can be seen as a powerful extension of both penalized likelihood and Bayesian approaches, in which penalization functions and prior distributions are replaced by more general luckiness functions, average-case methodology is replaced by a more robust worst-case approach, and in which methods classically viewed as highly distinct, such as AIC versus BIC and cross-validation versus Bayes can, to a large extent, be viewed from a unified perspective.


Author(s):  
J.D. Geller ◽  
C.R. Herrington

The minimum magnification for which an image can be acquired is determined by the design and implementation of the electron optical column and the scanning and display electronics. It is also a function of the working distance and, possibly, the accelerating voltage. For secondary and backscattered electron images there are usually no other limiting factors. However, for x-ray maps there are further considerations. The energy-dispersive x-ray spectrometers (EDS) have a much larger solid angle of detection that for WDS. They also do not suffer from Bragg’s Law focusing effects which limit the angular range and focusing distance from the diffracting crystal. In practical terms EDS maps can be acquired at the lowest magnification of the SEM, assuming the collimator does not cutoff the x-ray signal. For WDS the focusing properties of the crystal limits the angular range of acceptance of the incident x-radiation. The range is dependent upon the 2d spacing of the crystal, with the acceptance angle increasing with 2d spacing. The natural line width of the x-ray also plays a role. For the metal layered crystals used to diffract soft x-rays, such as Be - O, the minimum magnification is approximately 100X. In the worst case, for the LEF crystal which diffracts Ti - Zn, ˜1000X is the minimum.


2008 ◽  
Author(s):  
Sonia Savelli ◽  
Susan Joslyn ◽  
Limor Nadav-Greenberg ◽  
Queena Chen

Author(s):  
Akira YAMAWAKI ◽  
Hiroshi KAMABE ◽  
Shan LU
Keyword(s):  

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