Analysis conditions of an industrial Al–Mg–Si alloy by conventional and 3D atom probes

2001 ◽  
Vol 89 (1-3) ◽  
pp. 177-188 ◽  
Author(s):  
F Danoix ◽  
M.K Miller ◽  
A Bigot
Keyword(s):  
Atom Probes

ERRONEOUS COMPOSITION OF GaAs MASS-ANALYZED BY ATOM-PROBES

1984 ◽  
Vol 45 (C9) ◽  
pp. C9-465-C9-470 ◽  
Author(s):  
O. Nishikawa ◽  
H. Kawada ◽  
Y. Nagai ◽  
E. Nomura
Keyword(s):  
Atom Probes

Study on Quantitative Analysis of Carbon and Nitrogen in Stoichiometric θ-Fe3C and γ′-Fe4N by Atom Probe Tomography

2020 ◽  
Vol 26 (2) ◽  
pp. 185-193
Author(s):  
Jun Takahashi ◽  
Kazuto Kawakami ◽  
Yukiko Kobayashi
Keyword(s):  
Quantitative Analysis ◽  
Nitrogen Concentration ◽  
Pulsed Laser ◽  
Atom Probe ◽  
Carbon And Nitrogen ◽  
Atom Probes ◽  
Charge Spectrum ◽  
Preferential Evaporation ◽  
The Mean ◽  
Pulsed Voltage

AbstractThe quantitative analysis performance of carbon and nitrogen was investigated using stoichiometric θ-Fe3C (25 at% C) and γ′-Fe4N (~20 at% N) precipitates in pulsed voltage and pulsed laser atom probes. The dependencies of specimen temperature, pulse fraction, and laser pulse energy on the apparent concentrations of carbon and nitrogen were measured. Good coincidence with 25 at% carbon concentration in θ-Fe3C was obtained for the pulsed voltage atom probe by considering the mean number of carbon atoms per ion at 24 Da and the detection loss of iron, while better coincidence was obtained for the pulsed laser atom probe by considering only the mean number of carbon at 24 Da. On the other hand, a lack of nitrogen concentration in γ′-Fe4N was observed for the two atom probes. In particular, the pulsed laser atom probe showed a significant lack of nitrogen concentration. This implies that a large amount of 14N2+ was obscured by the main iron peak of 56Fe2+ at 28 Da in the mass-to-charge spectrum. Regarding preferential evaporation or retention, carbon in θ-Fe3C exhibited little of either, but nitrogen in γ′-Fe4N exhibited definite preferential retention. This result can be explained by the large difference in ionization energy between carbon and nitrogen.

First Data from a Commercial Local Electrode Atom Probe (LEAP)

2004 ◽  
Vol 10 (3) ◽  
pp. 373-383 ◽  
Author(s):  
Thomas F. Kelly ◽  
Tye T. Gribb ◽  
Jesse D. Olson ◽  
Richard L. Martens ◽  
Jeffrey D. Shepard ◽  
...  
Keyword(s):  
Data Collection ◽  
Three Dimensional ◽  
Atom Probe ◽  
Field Of View ◽  
Performance Parameters ◽  
Scientific Instruments ◽  
Materials Analysis ◽  
Collection Rate ◽  
Atom Probes

The first dedicated local electrode atom probes (LEAP [a trademark of Imago Scientific Instruments Corporation]) have been built and tested as commercial prototypes. Several key performance parameters have been markedly improved relative to conventional three-dimensional atom probe (3DAP) designs. The Imago LEAP can operate at a sustained data collection rate of 1 million atoms/minute. This is some 600 times faster than the next fastest atom probe and large images can be collected in less than 1 h that otherwise would take many days. The field of view of the Imago LEAP is about 40 times larger than conventional 3DAPs. This makes it possible to analyze regions that are about 100 nm diameter by 100 nm deep containing on the order of 50 to 100 million atoms with this instrument. Several example applications that illustrate the advantages of the LEAP for materials analysis are presented.

scholarly journals Atom Probes Leap Ahead

2003 ◽  
Vol 11 (5) ◽  
pp. 8-13 ◽  
Author(s):  
Thomas F. Kelly ◽  
Amy A. Gribb
Keyword(s):  
Atomic Scale ◽  
Atom Probes ◽  
Electron Microscopes ◽  
Human Inquiry

Since early times, the collective understanding of our microscopic universe has been directly tied to the quality of our microscopies. This has been true from the advent of light microscopes through to modern electron microscopes. Indeed, if one is to work on a given scale, one must be able to “see” at that scale. At the beginning of the 21st century, human inquiry is focused on the atomic scale.

The Performance of Electron Multipliers in FIM Atom Probes

1972 ◽  
Vol 43 (9) ◽  
pp. 1264-1267 ◽  
Author(s):  
S. S. Brenner ◽  
J. T. McKinney
Keyword(s):  
Atom Probes

Magnification and mass resolution in local-electrode atom probes

1996 ◽  
Vol 65 (1-2) ◽  
pp. 119-129 ◽  
Author(s):  
Sateesh S. Bajikar ◽  
David J. Larson ◽  
Thomas F. Kelly ◽  
Patrick P. Camus
Keyword(s):  
Mass Resolution ◽  
Atom Probes

Three‐dimensional atom probes

1997 ◽  
Vol 186 (1) ◽  
pp. 1-16 ◽  
Author(s):  
M. K. Miller
Keyword(s):  
Three Dimensional ◽  
Atom Probes

Atom probes of the future

1994 ◽  
Vol 52 ◽  
pp. 834-835
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
3D Images ◽  
New Era ◽  
Atom Probes ◽  
Position Sensitive ◽  
Third Dimension ◽  
Position Sensitive Detectors ◽  
Very High

Atom probe microscopy, which is based on the first ever atomic-scale imaging technique, field ion microscopy (FIM), has entered a new era in its development. Three-dimensional atom probes (3DAP) are now operating which produce 3D images with atomic scale resolution. It appears that the technology will soon be at hand to make 3DAPs do everything that their predecessor, the conventional atom probe, now does and also reach the third dimension. These microscopes will be simpler, smaller, faster, and much more powerful than the conventional atom probe. Several developments are responsible for this suggestion. 1) Rapid pulsing schemes are being developed which will make it possible to achieve on the order of 106 pulses per second. 2) Highspeed position-sensitive detectors (PSDs) have been designed which can detect several ions in a givenpulse with very high precision. 3) New specimen geometries will soon become possible which will revolutionize the atom probe. Let us consider the ramifications of each of these developments in turn.

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