First Data from a Commercial Local Electrode Atom Probe (LEAP)

2004 ◽  
Vol 10 (3) ◽  
pp. 373-383 ◽  
Author(s):  
Thomas F. Kelly ◽  
Tye T. Gribb ◽  
Jesse D. Olson ◽  
Richard L. Martens ◽  
Jeffrey D. Shepard ◽  
...  

The first dedicated local electrode atom probes (LEAP [a trademark of Imago Scientific Instruments Corporation]) have been built and tested as commercial prototypes. Several key performance parameters have been markedly improved relative to conventional three-dimensional atom probe (3DAP) designs. The Imago LEAP can operate at a sustained data collection rate of 1 million atoms/minute. This is some 600 times faster than the next fastest atom probe and large images can be collected in less than 1 h that otherwise would take many days. The field of view of the Imago LEAP is about 40 times larger than conventional 3DAPs. This makes it possible to analyze regions that are about 100 nm diameter by 100 nm deep containing on the order of 50 to 100 million atoms with this instrument. Several example applications that illustrate the advantages of the LEAP for materials analysis are presented.

Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman

Atom probe microscopy, which is based on the first ever atomic-scale imaging technique, field ion microscopy (FIM), has entered a new era in its development. Three-dimensional atom probes (3DAP) are now operating which produce 3D images with atomic scale resolution. It appears that the technology will soon be at hand to make 3DAPs do everything that their predecessor, the conventional atom probe, now does and also reach the third dimension. These microscopes will be simpler, smaller, faster, and much more powerful than the conventional atom probe. Several developments are responsible for this suggestion. 1) Rapid pulsing schemes are being developed which will make it possible to achieve on the order of 106 pulses per second. 2) Highspeed position-sensitive detectors (PSDs) have been designed which can detect several ions in a givenpulse with very high precision. 3) New specimen geometries will soon become possible which will revolutionize the atom probe. Let us consider the ramifications of each of these developments in turn.


1998 ◽  
Vol 4 (S2) ◽  
pp. 84-85
Author(s):  
Thomas F. Kelly ◽  
Patrick P. Camus

The Need for Improvements. Though atom probe techniques have impressive atomic-scale analytical capabilities, there are some definite needs for improvement. The needle shape of APFIM specimens is a difficult geometry to make for many types of materials, especially technologically important thin-film materials. Even though 3DAPs collect more data than traditional APs, the analysis volumes are still small by analytical standards: typically there are fewer than 1 million atoms in an image which is about 15nm x 15nm x 50nm. The data collection rate (up to tens of atoms per second) limits the practical size of analyzed volumes to about 1 million atoms. Poor mass resolution makes it difficult to separate ions of similar mass-to-charge ratio in spectra of approximately 20% of samples. Thus, there are three principal areas where improvements are desirable: 1) specimen geometry, 2) data collection rates, and 3) mass resolving power.


MRS Bulletin ◽  
2001 ◽  
Vol 26 (2) ◽  
pp. 102-107 ◽  
Author(s):  
A. Cerezo ◽  
D. J. Larson ◽  
G. D. W. Smith

Exactly 50 years ago, E.W. Müller became the first person to observe single atoms, with the aid of the field-ion microscope (FIM). In 1967, with John Panitz and S. Brooks McLane, Müller's invention of the atom probe meant that, in his words, “We can now really deal much more intimately with the individual atoms which we encounter, since we know their names.” By combining position-sensitive detection with the time-of-flight mass spectrometry of single atoms in the atom probe, Cerezo and co-workers in the late 1980s built an instrument capable of reconstructing the three-dimensional (3D) atomic distribution of elements present in a material. The instruments that are capable of microanalysis at this level, called generically 3D atom probes (3DAPs), were the subject of two articles published in MRS Bulletin in 1994. In this article, we review some of the progress in the field since that time, in particular, the expansion of the range of materials problems that can be addressed by this powerful technique.


2010 ◽  
Vol 17 (1) ◽  
pp. 15-25 ◽  
Author(s):  
Christian Oberdorfer ◽  
Guido Schmitz

AbstractAs a major improvement in three-dimensional (3D) atom probe, the range of applicable material classes has recently been broadened by the establishment of laser-assisted atom probes (LA-3DAP). Meanwhile, measurements of materials of low conductivity, such as dielectrics, ceramics, and semiconductors, have widely been demonstrated. However, besides different evaporation probabilities, heterogeneous dielectric properties are expected to give rise to additional artifacts in the 3D volume reconstruction on which the method is based. In this article, these conceivable artifacts are discussed based on a numeric simulation of the field evaporation. Sample tips of layer- or precipitate-type geometry are considered. It is demonstrated that dielectric materials tend to behave similarly to metals of reduced critical evaporation field.


2008 ◽  
Vol 16 (6) ◽  
pp. 10-13
Author(s):  
Robert M. Ulfig ◽  
David J. Larson ◽  
David A. Reinhard ◽  
Thomas F. Kelly

Like no other microscopy technique, atom-probe tomography (APT) requires detailed data analysis algorithms specific to the knowledge desired, as the data are both complex due to their three-dimensional nature and can only be collected in a digital format. With recent increases in speed and field of view available in contemporary instruments like the Imago Scientific Instruments LEAP™ microscopes, these challenges and significant benefits are exacerbated. In practice, ‘data collection’ in APT, as understood in complementary techniques like scanning electron microscopy (SEM) or transmission electron microscopy (TEM), does not even begin until after the atom-probe experiment is over and the microscopist leaves the laboratory. The sample is prepared into the appropriate needle-shaped geometry, field evaporated atom by atom, and the ‘experiment’ part of the specimen analysis is over as soon as the ions are detected and stored in a digital file.


2008 ◽  
Vol 14 (4) ◽  
pp. 296-305 ◽  
Author(s):  
Baptiste Gault ◽  
Frederic de Geuser ◽  
Leigh T. Stephenson ◽  
Michael P. Moody ◽  
Barrington C. Muddle ◽  
...  

The application of wide field-of-view detection systems to atom probe experiments emphasizes the importance of careful parameter selection in the tomographic reconstruction of the analyzed volume, as the sensitivity to errors rises steeply with increases in analysis dimensions. In this article, a self-consistent method is presented for the systematic determination of the main reconstruction parameters. In the proposed approach, the compression factor and the field factor are determined using geometrical projections from the desorption images. A three-dimensional Fourier transform is then applied to a series of reconstructions, and after comparing to the known material crystallography, the efficiency of the detector is estimated. The final results demonstrate a significant improvement in the accuracy of the reconstructed volumes.


Author(s):  
Badrinath Roysam ◽  
Hakan Ancin ◽  
Douglas E. Becker ◽  
Robert W. Mackin ◽  
Matthew M. Chestnut ◽  
...  

This paper summarizes recent advances made by this group in the automated three-dimensional (3-D) image analysis of cytological specimens that are much thicker than the depth of field, and much wider than the field of view of the microscope. The imaging of thick samples is motivated by the need to sample large volumes of tissue rapidly, make more accurate measurements than possible with 2-D sampling, and also to perform analysis in a manner that preserves the relative locations and 3-D structures of the cells. The motivation to study specimens much wider than the field of view arises when measurements and insights at the tissue, rather than the cell level are needed.The term “analysis” indicates a activities ranging from cell counting, neuron tracing, cell morphometry, measurement of tracers, through characterization of large populations of cells with regard to higher-level tissue organization by detecting patterns such as 3-D spatial clustering, the presence of subpopulations, and their relationships to each other. Of even more interest are changes in these parameters as a function of development, and as a reaction to external stimuli. There is a widespread need to measure structural changes in tissue caused by toxins, physiologic states, biochemicals, aging, development, and electrochemical or physical stimuli. These agents could affect the number of cells per unit volume of tissue, cell volume and shape, and cause structural changes in individual cells, inter-connections, or subtle changes in higher-level tissue architecture. It is important to process large intact volumes of tissue to achieve adequate sampling and sensitivity to subtle changes. It is desirable to perform such studies rapidly, with utmost automation, and at minimal cost. Automated 3-D image analysis methods offer unique advantages and opportunities, without making simplifying assumptions of tissue uniformity, unlike random sampling methods such as stereology.12 Although stereological methods are known to be statistically unbiased, they may not be statistically efficient. Another disadvantage of sampling methods is the lack of full visual confirmation - an attractive feature of image analysis based methods.


Energies ◽  
2021 ◽  
Vol 14 (7) ◽  
pp. 1940
Author(s):  
Muhammad Usman Naseer ◽  
Ants Kallaste ◽  
Bilal Asad ◽  
Toomas Vaimann ◽  
Anton Rassõlkin

This paper presents current research trends and prospects of utilizing additive manufacturing (AM) techniques to manufacture electrical machines. Modern-day machine applications require extraordinary performance parameters such as high power-density, integrated functionalities, improved thermal, mechanical & electromagnetic properties. AM offers a higher degree of design flexibility to achieve these performance parameters, which is impossible to realize through conventional manufacturing techniques. AM has a lot to offer in every aspect of machine fabrication, such that from size/weight reduction to the realization of complex geometric designs. However, some practical limitations of existing AM techniques restrict their utilization in large scale production industry. The introduction of three-dimensional asymmetry in machine design is an aspect that can be exploited most with the prevalent level of research in AM. In order to take one step further towards the enablement of large-scale production of AM-built electrical machines, this paper also discusses some machine types which can best utilize existing developments in the field of AM.


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