Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

1998 ◽  
Vol 72 (3-4) ◽  
pp. 109-119 ◽  
Author(s):  
Stephan Uhlemann ◽  
Maximilian Haider
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Spherical Aberration ◽  
Transmission Electron ◽  
Aberration Corrected

First application of a spherical‐aberration corrected transmission electron microscope in materials science

2002 ◽  
Vol 51 (suppl 1) ◽  
pp. S51-S58 ◽  
Author(s):  
Bernd Kabius ◽  
Max Haider ◽  
Stefan Uhlemann ◽  
Eugen Schwan ◽  
Knut Urban ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Materials Science ◽  
Spherical Aberration ◽  
Transmission Electron ◽  
Aberration Corrected

Seeing is Not Always Believing: Reduction of Artefacts by an Improved Point Resolution With a Spherical Aberration Corrected 200 Kv Transmission Electron Microscope

1997 ◽  
Vol 3 (S2) ◽  
pp. 1179-1180 ◽  
Author(s):  
M. Haider ◽  
S. Uhlemann
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Materials Science ◽  
Imaging System ◽  
Periodic Structures ◽  
Spherical Aberration ◽  
Spatial Frequencies ◽  
Transmission Electron ◽  
Set Up ◽  
Aberration Corrected

The most interesting structures in materials science are non-periodic areas where the crystalline structure is disturbed such as interfaces, defects or dislocations. These non-periodic structures can be hidden by artefacts, caused by aberrations, and therefore they can be easier analysed if an aberration free imaging system can be used. Therefore, in order to improve the point resolution and to obtain easier access to the hidden information, a spherical aberration corrected 200 kV TEM, following a proposal by Rose, was set up.Phase contrast in a transmission electron microscope (TEM) is obtained, as it was shown by Scherzer, due to the phase shifting power of the wave aberrations as there are: the defocus and the spherical aberration. The defocus can be optimised in terms of the well transferred bandwidth of spatial frequencies (Scherzer defocus) Δfsch = (Cs*λ.)1/2. The upper limit of the spatial frequency without a contrast reversal when choosing a Scherzer defocus is called the point resolution d ≈ 0.71 (Cs λ3)1/4.

A spherical-aberration-corrected 200kV transmission electron microscope

1998 ◽  
Vol 75 (1) ◽  
pp. 53-60 ◽  
Author(s):  
Max Haider ◽  
Harald Rose ◽  
Stephan Uhlemann ◽  
Eugen Schwan ◽  
Bernd Kabius ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Spherical Aberration ◽  
Transmission Electron ◽  
Aberration Corrected

scholarly journals Performance and Application of Chromatic/Spherical Aberration-Corrected 30 kV Transmission Electron Microscope

2011 ◽  
Vol 17 (S2) ◽  
pp. 1530-1531 ◽  
Author(s):  
T Sasaki ◽  
H Sawada ◽  
F Hosokawa ◽  
Y Shimizu ◽  
T Nakamichi ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Spherical Aberration ◽  
Transmission Electron ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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