Magnetic depth profiles in strained nickel thin films measured by polarized neutron reflectometry

1997 ◽  
Vol 165 (1-3) ◽  
pp. 475-478 ◽  
Author(s):  
F. Ott ◽  
C. Fermon
1995 ◽  
Vol 52 (14) ◽  
pp. 10395-10404 ◽  
Author(s):  
Huai Zhang ◽  
J. W. Lynn ◽  
C. F. Majkrzak ◽  
S. K. Satija ◽  
J. H. Kang ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document