Kinetics of interface alloy phase formation at nanometer length scale in ultra-thin films: X-ray and polarized neutron reflectometry

2018 ◽  
Vol 96 ◽  
pp. 1-50 ◽  
Author(s):  
Surendra Singh ◽  
Mitali Swain ◽  
Saibal Basu
Keyword(s):  
Thin Films ◽  
Phase Formation ◽  
Neutron Reflectometry ◽  
Length Scale ◽  
X Ray ◽  
Nanometer Length Scale ◽  
Polarized Neutron ◽  
Kinetics Of ◽  
Polarized Neutron Reflectometry

Measurements of magnetic screening lengths in superconducting Nb thin films by polarized neutron reflectometry

1995 ◽  
Vol 52 (14) ◽  
pp. 10395-10404 ◽  
Author(s):  
Huai Zhang ◽  
J. W. Lynn ◽  
C. F. Majkrzak ◽  
S. K. Satija ◽  
J. H. Kang ◽  
...  
Keyword(s):  
Thin Films ◽  
Neutron Reflectometry ◽  
Magnetic Screening ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Enhancement of Aurivillius Phase Formation Kinetics in SBT Thin Films using Nanoparticle Seeding

2003 ◽  
Vol 784 ◽  
Author(s):  
Yun-Mo Sung ◽  
Woo-Chul Kwak ◽  
Se-Yon Jung ◽  
Seung-Joon Hwang
Keyword(s):  
Thin Films ◽  
Activation Energy ◽  
Phase Transformation ◽  
Phase Formation ◽  
X Ray Diffraction ◽  
Aurivillius Phase ◽  
X Ray ◽  
Si Substrates ◽  
Formation Kinetics ◽  
Kinetics Of

ABSTRACTPt/Ti/SiO2/Si substrates seeded by SBT nanoparticles (∼60–80 nm) were used to enhance the phase formation kinetics of Sr0.7Bi2.4Ta2O9 (SBT) thin films. The volume fractions of Aurivillius phase formation obtained through quantitative x-ray diffraction (Q-XRD) analyses showed highly enhanced kinetics in seeded SBT thin films. The Avrami exponents were determined as ∼1.4 and ∼0.9 for unseeded and seeded SBT films, respectively, which reveals different nucleation modes. By using Arrhenius–type plots the activation energy values for the phase transformation of unseeded and seeded SBT thin films were determined to be ∼264 and ∼168 kJ/mol, respectively. This gives a key reason to the enhanced kinetics in seeded films. Microstructural analyses on unseeded SBT thin films showed formation of randomly oriented needle-like crystals, while those on seeded ones showed formation of domains comprised of directionally grown worm-like crystals.

Investigation of partially deuterated organic multilayers by means of X-ray and polarized neutron reflectometry

Neutron News ◽  
2000 ◽  
Vol 11 (4) ◽  
pp. 29-32 ◽  
Author(s):  
A. Kharchenko ◽  
U. Englisch ◽  
Th. Geue ◽  
J. Grenzer ◽  
U. Pietsch ◽  
...  
Keyword(s):  
Neutron Reflectometry ◽  
X Ray ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry
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