scholarly journals Polarized neutron reflectometry with polarization analysis: an ultra-sensitive tool for the magnetism of thin films

1996 ◽  
Vol 52 (a1) ◽  
pp. C34-C34
Author(s):  
C. Fermon
1995 ◽  
Vol 52 (14) ◽  
pp. 10395-10404 ◽  
Author(s):  
Huai Zhang ◽  
J. W. Lynn ◽  
C. F. Majkrzak ◽  
S. K. Satija ◽  
J. H. Kang ◽  
...  

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