scholarly journals Measuring lateral magnetic structures in thin films using time-of-flight polarized neutron reflectometry

2003 ◽  
Vol 335 (1-4) ◽  
pp. 77-81 ◽  
Author(s):  
W.-T. Lee ◽  
F. Klose ◽  
H.Q. Yin ◽  
B.P. Toperverg
Keyword(s):  
Thin Films ◽  
Time Of Flight ◽  
Neutron Reflectometry ◽  
Magnetic Structures ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Measurements of magnetic screening lengths in superconducting Nb thin films by polarized neutron reflectometry

1995 ◽  
Vol 52 (14) ◽  
pp. 10395-10404 ◽  
Author(s):  
Huai Zhang ◽  
J. W. Lynn ◽  
C. F. Majkrzak ◽  
S. K. Satija ◽  
J. H. Kang ◽  
...  
Keyword(s):  
Thin Films ◽  
Neutron Reflectometry ◽  
Magnetic Screening ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

scholarly journals Time-of-Flight Polarized Neutron Reflectometry on PLATYPUS: Status and Future Developments

2013 ◽  
Vol 42 ◽  
pp. 213-217 ◽  
Author(s):  
T. Saerbeck ◽  
D.L. Cortie ◽  
S. Brück ◽  
J. Bertinshaw ◽  
S.A. Holt ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Neutron Reflectometry ◽  
Future Developments ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry
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