Layer-by-layer in situ stress measurements of metallic multilayers with atomic-layer sensitivity

1999 ◽  
Vol 198-199 ◽  
pp. 602-604 ◽  
Author(s):  
Young-Seok Kim ◽  
Sung-Chul Shin
2017 ◽  
Vol 220 ◽  
pp. 76-84 ◽  
Author(s):  
Jianju Du ◽  
Xianghui Qin ◽  
Qingli Zeng ◽  
Luqing Zhang ◽  
Qunce Chen ◽  
...  

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