Investigation of in situ Raman spectra for the control of PLD of YBCO thin film superconductors

2000 ◽  
Vol 13 (5) ◽  
pp. 589-596 ◽  
Author(s):  
John Busbee ◽  
Rand Biggers ◽  
Gregory Kozlowski ◽  
Iman Maartense ◽  
John Jones ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectra ◽  
Ybco Thin Film ◽  
In Situ Raman

“In-Situ Raman Spectroscopy of Electronic Processes in Fullerene Thin Films

2002 ◽  
Vol 725 ◽  
Author(s):  
S.B. Phelan ◽  
B.S. O'Connell ◽  
G. Farrell ◽  
G. Chambers ◽  
H.J. Byrne
Keyword(s):  
Thin Film ◽  
Indium Tin Oxide ◽  
Low Temperatures ◽  
In Situ Raman Spectroscopy ◽  
State Reduction ◽  
In Situ Raman ◽  
Linear Behavior ◽  
Current Voltage ◽  
Solid State Reduction

AbstractThe current voltage characteristics of C60 thin film sandwich structures fabricated by vacuum deposition on indium tin oxide (ITO) with an aluminium top electrode are presented and discussed. A strongly non-linear behavior and a sharp increase in the device conductivity was observed at relatively low voltages (∼2V), at both room and low temperatures (20K). At room temperature the system is seen to collapse, and in situ Raman measurements indicate a solid state reduction of the fullerene thin film to form a polymeric state. The high conductivity state was seen to be stable at elevated voltages and low temperatures. This state is seen to be reversible with the application of high voltages. At these high voltages the C60 film was seen to sporadically emit white light at randomly localized points analogous to the much documented Electroluminescence in single crystals.

Study of the Redox Process of Poly(5‐amino‐1‐naphthol) Thin Film by In Situ Raman Spectroscopy

1996 ◽  
Vol 143 (7) ◽  
pp. 2116-2119 ◽  
Author(s):  
Malik Mostefai ◽  
Minh‐Chau Pham ◽  
Jean‐Pierre Marsault ◽  
Jean Aubard ◽  
Pierre‐Camille Lacaze
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Redox Process ◽  
In Situ Raman Spectroscopy ◽  
In Situ Raman

In situ Raman spectra of an NAD+-modified silver electrode at various potentials

2004 ◽  
Vol 35 (3) ◽  
pp. 190-194 ◽  
Author(s):  
Haifeng Yang ◽  
Zongrang Zhang ◽  
Guoli Shen ◽  
Ruqin Yu
Keyword(s):  
Raman Spectra ◽  
Silver Electrode ◽  
In Situ Raman

In Situ Measurements of Raman Spectra for PLZT Ceramics under Compressive Stresses

2016 ◽  
Vol 680 ◽  
pp. 25-29
Author(s):  
Li Ping Liang ◽  
Xuan Cheng ◽  
Ying Zhang
Keyword(s):  
Raman Spectra ◽  
Lead Zirconate Titanate ◽  
Scattered Light ◽  
Solid State Reaction Method ◽  
Lead Zirconate ◽  
Ceramic Specimen ◽  
Conventional Solid State Reaction ◽  
In Situ Raman ◽  
Compressive Stresses

A lanthanum doped lead zirconate titanate (PLZT) ceramic specimen was prepared by the conventional solid state reaction method. The crystal phase and morphology of the PLZT specimen were characterized by XRD and SEM techniques, with the hysteresis loop by RT6000HVS system. The compressive stress was applied to the PLZT specimen through the microtest mechanical loading device. In-situ Raman spectra focused on a fixed grain under various compressive stresses were recorded for different polarization directions of the scattered light. The effects of stresses on the Raman spectra and the intensity ratio between the E+B1 and E(2TO) modes are discussed.

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