Interfacial forces between silica surfaces measured by atomic force microscopy

2009 ◽  
Vol 21 (1) ◽  
pp. 30-34 ◽  
Author(s):  
Jinming DUAN
2020 ◽  
Vol 124 (48) ◽  
pp. 26296-26303
Author(s):  
J. Hernández-Muñoz ◽  
M. R. Uhlig ◽  
S. Benaglia ◽  
E. Chacón ◽  
P. Tarazona ◽  
...  

1998 ◽  
Vol 543 ◽  
Author(s):  
V. Pasquier ◽  
J. M. Drake

AbstractLateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.


2007 ◽  
Vol 41 (15) ◽  
pp. 3449-3457 ◽  
Author(s):  
Bogdan C. Donose ◽  
Anh V. Nguyen ◽  
Geoffrey M. Evans ◽  
Yaode Yan

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