A mass peak profile generation model to facilitate determination of elemental compositions of ions based on exact masses and isotopic abundances

1997 ◽  
Vol 8 (2) ◽  
pp. 170-182 ◽  
Author(s):  
Andrew H. Grange ◽  
William C. Brumley
1999 ◽  
Vol 82 (6) ◽  
pp. 1443-1457 ◽  
Author(s):  
Andrew H Grange ◽  
G Wayne Sovocool

Abstract Identification of compounds in mixtures of environmental contaminants or synthetic products is essential for regulatory analyses. Exact masses of ions determined by high resolution mass spectrometry provide unique elemental compositions only for low-mass ions (<150 Da). Using mass peak profiling from selected-ion recording data (MPPSIRD) to acquire additional mass spectral data and a profile generation model (PGM) for automated interpretation of the data, provides elemental compositions for ions with m/z up to 600, based on incontestable properties of atoms, their exact masses, isotopic abundances, and valences. In this study, MPPSIRD and a PGM were used to identify intended and unintended products resulting from attempted syntheses of 2 thermolabile, nonionic, phosphorothioate compounds. The products were volatilized from a probe inserted into a VG70-250SE double-focusing mass spectrometer. High mass resolution substituted separation in the mass domain for the temporal separation of most components provided by chromatographic techniques. MPPSIRD and the PGM identified the correct composition for M+• by rejecting all other compositions that were possible within the error limits of the exact mass determinations for M+• MPPSIRD was used with 10 000-24 000 resolution to determine exact masses of ions prominent in mass spectra and to isolate signals from different ions with the same nominal mass. Superposition of volatilization peaks of ions and linked scans (constant magnetic field to electrostatic sector voltage ratio) correlated fragment ions with the molecular ion. The PGM determined the compositions of fragment ions, using the number of atoms of each element in the molecular ion as limits. Fragmentation schemes based on these ions and the tables of exact masses and relative abundances provided a preponderance of evidence for the product identities.


1996 ◽  
Vol 68 (3) ◽  
pp. 553-560 ◽  
Author(s):  
Andrew H. Grange ◽  
Joseph R. Donnelly ◽  
G. Wayne Sovocool ◽  
William C. Brumley

2017 ◽  
Vol 23 (2) ◽  
pp. 300-306 ◽  
Author(s):  
Andrew J. London ◽  
Daniel Haley ◽  
Michael P. Moody

AbstractDue to the intrinsic evaporation properties of the material studied, insufficient mass-resolving power and lack of knowledge of the kinetic energy of incident ions, peaks in the atom probe mass-to-charge spectrum can overlap and result in incorrect composition measurements. Contributions to these peak overlaps can be deconvoluted globally, by simply examining adjacent peaks combined with knowledge of natural isotopic abundances. However, this strategy does not account for the fact that the relative contributions to this convoluted signal can often vary significantly in different regions of the analysis volume; e.g., across interfaces and within clusters. Some progress has been made with spatially localized deconvolution in cases where the discrete microstructural regions can be easily identified within the reconstruction, but this means no further point cloud analyses are possible. Hence, we present an ion-by-ion methodology where the identity of each ion, normally obscured by peak overlap, is resolved by examining the isotopic abundance of their immediate surroundings. The resulting peak-deconvoluted data are a point cloud and can be analyzed with any existing tools. We present two detailed case studies and discussion of the limitations of this new technique.


1960 ◽  
Vol 4 ◽  
pp. 495-512
Author(s):  
D. Moroz ◽  
D. E. Fornwalt ◽  
S. Aconsky ◽  
J. Doyle ◽  
W. R. Clough

AbstractTechniques were developed and statistically evaluated for the determination of both the homogeneity and the elemental compositions of columbium alloy ingots. X-ray fluorescent spectrography and automatic data handling systems are utilized. Sample preparation is discussed in detail from the consumable-electrode arc-melt process to the final physical form suitable for X-ray fluorescent spectrography. Arrangements of apparatus for obtaining, recording, processing, and interpreting data, with specific attention to limitations for various matrices, are treated at length.The method has been applied to specific cases with, for example, a correlation of the degree of variation of homogeneity of columbium alloy ingots with remelting practice. An attempt is made to provide a preliminary basis for determining the value of the technique as a possible means of quality control.


1977 ◽  
Vol 21 ◽  
pp. 143-147
Author(s):  
I. Vander

Traditionally, in X-ray fluorescence analysis for the determination of elemental compositions, the fluorescence is measured from the irradiated side of the sample. The composition measurements obtained by this method are sensitive to a gradient in composition as a function of depth of the element being measured. This report presents a simple method for measuring a mean composition for an element segregated in layers applicable to thin samples so that the fluorescence can be measured on the side opposite to that being irradiated. It is shown that for a particular relation between the angle of incidence of the primary radiation and of the detection angle on the opposite side of the sample that a mean concentration can be measured for an element which is independent of the composition in the separate layers.


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