XXVI.—The Monomial Expansion of Determinantal Symmetric Functions

1943 ◽  
Vol 61 (3) ◽  
pp. 300-310 ◽  
Author(s):  
A. C. Aitken
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
The Difference ◽  
Image Position

The quotient of alternantsthe denominator being the difference-product of the arguments a, β, γ, …, is an important symmetric function, introduced into algebra by Jacobi in 1841.

scholarly journals On Determinants of Symmetric Functions

1927 ◽  
Vol 1 (1) ◽  
pp. 55-61 ◽  
Author(s):  
A. C. Aitken
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
The Other ◽  
Elementary Symmetric Functions ◽  
The Difference ◽  
Image Position

The result of dividing the alternant |aαbβcγ…| by the simplest alternant |a0b1c2…| (the difference-product of a, b, c, …) is known to be a symmetric function expressible in two distinct ways, (1) as a determinant having for elements the elementary symmetric functions C, of a, b, c, …, (2) as a determinant having for elements the complete homogeneous symmetric functions Hr. For exampleThe formation of the (historically earlier) H-determinant is evident. The suffixes in the first row are the indices of the alternant; those of the other rows decrease by unit steps. This result is due to Jacobi.

Inequalities for Generalized Symmetric Functions

1969 ◽  
Vol 12 (5) ◽  
pp. 615-623 ◽  
Author(s):  
K.V. Menon
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
Elementary Symmetric Function ◽  
Generating Series ◽  
Image Position ◽  
Complete Symmetric Function

The generating series for the elementary symmetric function Er, the complete symmetric function Hr, are defined byrespectively.

Two inequalities for the complete symmetric functions

1978 ◽  
Vol 84 (1) ◽  
pp. 1-3 ◽  
Author(s):  
V. J. Baston
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
Positive Definite ◽  
Even Order ◽  
Image Position ◽  
Complete Symmetric Function ◽  
Special Case

In (l) Hunter proved that the complete symmetric functions of even order are positive definite by obtaining the inequalitywhere ht denotes the complete symmetric function of order t. In this note we show that the inequality can be strengthened, which, in turn, enables theorem 2 of (l) to be sharpened. We also obtain a special case of an inequality conjectured by McLeod(2).

Linear Transformations on Algebras of Matrices: The Invariance of the Elementary Symmetric Functions

1959 ◽  
Vol 11 ◽  
pp. 383-396 ◽  
Author(s):  
Marvin Marcus ◽  
Roger Purves
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
Similarity Transformation ◽  
Elementary Symmetric Function ◽  
Linear Transformations ◽  
Elementary Symmetric Functions ◽  
Image Position

In this paper we examine the structure of certain linear transformations T on the algebra of w-square matrices Mn into itself. In particular if A ∈ Mn let Er(A) be the rth elementary symmetric function of the eigenvalues of A. Our main result states that if 4 ≤ r ≤ n — 1 and Er(T(A)) = Er(A) for A ∈ Mn then T is essentially (modulo taking the transpose and multiplying by a constant) a similarity transformation:No such result as this is true for r = 1,2 and we shall exhibit certain classes of counterexamples. These counterexamples fail to work for r = 3 and the structure of those T such that E3(T(A)) = E3(A) for all ∈ Mn is unknown to us.

An Inequality for Elementary Symmetric Functions

1972 ◽  
Vol 15 (1) ◽  
pp. 133-135 ◽  
Author(s):  
K. V. Menon
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
Geometric Mean ◽  
Binomial Coefficient ◽  
Elementary Symmetric Function ◽  
Elementary Symmetric Functions ◽  
Image Position

Let Er denote the rth elementary symmetric function on α1 α2,…,αm which is defined by1E0 = 1 and Er=0(r>m).We define the rth symmetric mean by2where denote the binomial coefficient. If α1 α2,…,αm are positive reals thenwe have two well-known inequalities3and4In this paper we consider a generalization of these inequalities. The inequality (4) is known as Newton's inequality which contains the arithmetic and geometric mean inequality.

scholarly journals On Determinantal Symmetric Functions

1934 ◽  
Vol 4 (1) ◽  
pp. 47-52
Author(s):  
Zia-ud-Din
Keyword(s):  
Symmetric Functions ◽  
Symmetric Polynomials ◽  
The Difference ◽  
Dual Identities ◽  
Image Position

§ 1. The theory of symmetric polynomials abounds in dual identities and symmetries of various kinds. It has been investigated from the determinantal standpoint largely by means of quotients of alternants, such as,the denominator being the difference product of a, b, c, …, a simple alternant.

4. On a Class of Permanent Symmetric Functions

1882 ◽  
Vol 11 ◽  
pp. 409-418 ◽  
Author(s):  
Thomas Muir
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
General Sense ◽  
Image Position

By Cauchy the word “symmetric,” as applied to functions, was used in a more general sense than that in which we ordinarily use it now, or than that in which it was used before his time. He spoke of “fonctions symétriques permanentes” and “fonctions symétriques alternées:” we apply the word symmetric only to certain of the first of these; the second we call simply “alternating functions.” Thus the expressionwas called by him a permanent symmetric function, since if a1, a2, a3 are interchanged in order with b1, b2, b3, the function remains unaltered. It would be more definite to say that it is a permanent symmetric function with respect to a1, a2, a3 and b1, b2, b3.

scholarly journals An Inequality for Complete Symmetric Functions

1978 ◽  
Vol 21 (4) ◽  
pp. 503-504 ◽  
Author(s):  
Samuel A. Ilori
Keyword(s):  
Symmetric Function ◽  
Symmetric Functions ◽  
Real Numbers ◽  
Positive Real ◽  
Image Position ◽  
Complete Symmetric Function

Consider the identitywhere aj, …, am are positive real numbers. Then for r = 1, 2, 3, … Tr =Tr(a1, …, am) is called the rth complete symmetric function in a1, …, am (T0=l).

The role of differential phase contrast in electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 176-177
Author(s):  
E.M. Waddell ◽  
J.N. Chapman ◽  
R.P. Ferrier
Keyword(s):  
Phase Contrast ◽  
Practical Method ◽  
Position Vector ◽  
Differential Phase ◽  
Pure Phase ◽  
Differential Phase Contrast ◽  
The Difference ◽  
Image Position ◽  
First Moment

Dekkers and de Lang (1977) have discussed a practical method of realising differential phase contrast in a STEM. The method involves taking the difference signal from two semi-circular detectors placed symmetrically about the optic axis and subtending the same angle (2α) at the specimen as that of the cone of illumination. Such a system, or an obvious generalisation of it, namely a quadrant detector, has the characteristic of responding to the gradient of the phase of the specimen transmittance. In this paper we shall compare the performance of this type of system with that of a first moment detector (Waddell et al.1977).For a first moment detector the response function R(k) is of the form R(k) = ck where c is a constant, k is a position vector in the detector plane and the vector nature of R(k)indicates that two signals are produced. This type of system would produce an image signal given bywhere the specimen transmittance is given by a (r) exp (iϕ (r), r is a position vector in object space, ro the position of the probe, ⊛ represents a convolution integral and it has been assumed that we have a coherent probe, with a complex disturbance of the form b(r-ro) exp (iζ (r-ro)). Thus the image signal for a pure phase object imaged in a STEM using a first moment detector is b2 ⊛ ▽ø. Note that this puts no restrictions on the magnitude of the variation of the phase function, but does assume an infinite detector.

Kinematical and Dynamical CBED Pattern Models: Increasing the Accuracy of the Unit-Cell Parameter Measurements Based on CBED Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 540-541
Author(s):  
I.N. Yadhikov ◽  
S.K. Maksimov
Keyword(s):  
Reciprocal Lattice ◽  
Unit Cell ◽  
Reciprocal Lattice Vector ◽  
Unit Cell Parameters ◽  
Lattice Vector ◽  
Cell Parameters ◽  
Accuracy Of Measurements ◽  
The Difference ◽  
Image Position ◽  
Convergent Beam

Convergent beam electron diffraction (CBED) is widely used as a microanalysis tool. By the relative position of HOLZ-lines (Higher Order Laue Zone) in CBED-patterns one can determine the unit cell parameters with a high accuracy up to 0.1%. For this purpose, maps of HOLZ-lines are simulated with the help of a computer so that the best matching of maps with experimental CBED-pattern should be reached. In maps, HOLZ-lines are approximated, as a rule, by straight lines. The actual HOLZ-lines, however, are different from the straights. If we decrease accelerating voltage, the difference is increased and, thus, the accuracy of the unit cell parameters determination by the method becomes lower.To improve the accuracy of measurements it is necessary to give up the HOLZ-lines substitution by the straights. According to the kinematical theory a HOLZ-line is merely a fragment of ellipse arc described by the parametric equationwith arc corresponding to change of β parameter from -90° to +90°, wherevector, h - the distance between Laue zones, g - the value of the reciprocal lattice vector, g‖ - the value of the reciprocal lattice vector projection on zero Laue zone.

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