Measurement of multiphoton absorption and electron avalanche in optical thin films
Keyword(s):
Measurements on nonlinear processes caused by multiphoton absorption and electron avalanche in optical thin films have been carried out using KrF lasers of 20-ns and 1.7-ps pulse duration. Multiphoton absorption of the order of 10-7 J was detected by a photoacoustic signal, and the nonlinear growth of photo-induced current due to the electron avalanche was analyzed dynamically. The correlation between damage threshold and carrier lifetime was investigated for oxide and fluoride coatings.
1987 ◽
Vol 45
◽
pp. 366-367
Keyword(s):
1983 ◽
Vol 44
(11)
◽
pp. 1247-1255
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2000 ◽
Vol 154-155
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pp. 467-472
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Keyword(s):
2020 ◽
Vol 124
(40)
◽
pp. 22011-22018