Image Reconstruction Applied to High Voltage Microscopy
1974 ◽
Vol 32
◽
pp. 396-397
Keyword(s):
Greatly increased specimen penetration, which is the principle advantage of high voltage electron microscopy, carries with it an increased need for techniques to interpret the large amount of three-dimensional information projected into two-dimensional micrographs. Stereo views can provide very useful information and are widely used. However, for the general specimen, stereo views are limited in their ability to produce quantitative results. At the high voltage microscope facility, Univ. of Wisconsin, we have begun a program to develop and apply three dimensional reconstruction techniques to the microscopy of thick specimens.
1993 ◽
Vol 61
(10)
◽
pp. 4485-4488
◽
1992 ◽
Vol 50
(1)
◽
pp. 592-593
1977 ◽
Vol 35
◽
pp. 570-571
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1988 ◽
Vol 46
◽
pp. 362-363
2001 ◽
Vol 34
(3)
◽
pp. 153-169
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1991 ◽
Vol 163
(2)
◽
pp. 221-231
◽
2016 ◽
Vol 57
(6)
◽
pp. 918-921
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