Tensile Creep of Y-Si3N4: II. Cavitation
1991 ◽
Vol 49
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pp. 972-973
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Keyword(s):
ATEM has been used to characterize three different silicon nitride materials after tensile creep in air at 1200 to 1400° C. In Part I, the microstructures and microstructural changes that occur during testing were described, and consistent with that description the designations and sintering aids for these materials were: W/YAS, a SiC whisker reinforced Si3N4 processed with yttria (6w/o) and alumina (1.5w/o); YAS, Si3N4 processed with yttria (6 w/o) and alumina (1.5w/o); and YS, Si3N4 processed with yttria (4.0 w/o). This paper, Part II, addresses the interfacial cavitation processes that occur in these materials and which are ultimately responsible for creep rupture.
2004 ◽
Vol 85
(2)
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pp. 408-414
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1993 ◽
Vol 76
(12)
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pp. 3105-3112
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1993 ◽
Vol 89-91
◽
pp. 569-574
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1990 ◽
pp. 405-421
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