Fixed-Beam-Excitation Auger EM with Simulated Specimens: AEM-1

Author(s):  
J. W. Coleman ◽  
E.H. Jacobsen

AEM-1 is the first in a series of three prototypes of a fixed-beam-excitation Auger electron microscope. Because Auger electrons have energies dependent only upon the structure of the atoms from which they are emitted, they are atomic signatures. If the Augers can be used for imaging the specimen, the sites of the emitting atoms can also be established. With such an energy-analyzing optical-imaging system, there is no need for heavy metal staining or isomorphic replacement for low-Z atoms, and thus our ultimate goal (with AEM-3) is the direct observation of atomic carbon, oxygen, and nitrogen in micrographs of biological material. AEM-1, however, was built specifically to study the problems of high quality imaging with very wide angle lenses, and it uses an Auger electron source simulated by an microgun of variable (50-700ev) energy.

1997 ◽  
Author(s):  
Makoto M. Miyahara ◽  
Shouji Ohtsuka ◽  
Shuji Taniho ◽  
V. Ralph Algazi

2013 ◽  
Vol 278-280 ◽  
pp. 50-53
Author(s):  
Qing Hua Lv ◽  
Xiao Zhu ◽  
Zhong Bao Xu ◽  
Zhong Sheng Zhai ◽  
Shuang Zou

Abstract. A diffraction limited circularly symmetric optical imaging system with “0,π” phase pupil mask was studied, which extended depth of field. The optimal radiuses of the mask in the different amount of defocus are calculated, which in a certain contrast value 0.05 and 0.1, can provide the largest spatial frequency band. On the other hand, the effect of mask manufacturing error is analyzed, and the performance of the simulation imaging system has been verified experimentally that the image system still can obtain the high quality output images even without any post-processing.


2014 ◽  
Vol 39 (13) ◽  
pp. 3830 ◽  
Author(s):  
Nan Zhu ◽  
Suman Mondal ◽  
Shengkui Gao ◽  
Samuel Achilefua ◽  
Viktor Gruev ◽  
...  

2017 ◽  
Vol 405 ◽  
pp. 177-184 ◽  
Author(s):  
Jhao-Ming Yu ◽  
Min-Chun Pan ◽  
Liang-Yu Chen ◽  
Min-Cheng Pan ◽  
Ya-Fen Hsu

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