Electron Microscopy in the Study of Magnetic Materials
The aim of this paper is to highlight in brief two main areas in recent electron microscope studies of magnetic materials. The first is in detailed micromagnetic investigations of a fundamental kind and the second is the observation and characterisation of magnetic properties, magnetic domain structure and microstructure in technically important materials. Detailed quantitative investigations of micromagnetic features have, of necessity, been confined to specialist techniques of Lorentz microscopy (LEM). However, conventional modes of TEM and SEM, and X-ray microanalysis complement the defocussed or Fresnel mode of LEM in giving a detailed characterisation of iragnetic materials. It is in this context that LEM has found the widest application.