Characterization of the (0110) α-Ti/γ-TiH Interface Using High-Resolution Transmission Electron Microscopy (TEM) and Electron Energy Loss Spectroscopy (EELS)

1996 ◽  
Vol 54 ◽  
pp. 108-109
Author(s):  
M. M. Tsai ◽  
J. M. Howe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Hydrogen Atoms ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
High Resolution Images ◽  
Electron Energy Loss ◽  
Image Simulations

Precipitation of γ-TiH in α-Ti-H alloys involves a hcp → fct lattice transformation with hydrogen as an interstitial diffusing element Results obtained from a previous TEM study have shown that the lengthening rate of γ-TiH is diffusionally controlled at 25°C, and possibly interfacially controlled at temperatures of 50°C and higher. Therefore, it is essential to ascertain the presence or absence of hydrogen atoms at the interface. TEM foils from a 800 ppm wt.% Ti-H alloy were analyzed using high-resolution TEM and image simulations in order to determine the effects of hydrogen on high-resolution images of the α-Ti/γ-TiH interface, and EELS was used to determine the whether the hydnde structure was fully formed up to the interface.

TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System

2012 ◽  
Vol 590 ◽  
pp. 9-12 ◽  
Author(s):  
Tamara Mekhantseva ◽  
Oleg Voitenko ◽  
Ilya Smirnov ◽  
Evgeny Pustovalov ◽  
Vladimir Plotnikov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Amorphous Alloys ◽  
Electron Tomography ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
High Resolution Images ◽  
Electron Energy Loss ◽  
Tomography Analysis

This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS).

scholarly journals Transmission electron microscopy as an important tool for characterization of zeolite structures

2018 ◽  
Vol 5 (11) ◽  
pp. 2836-2855 ◽  
Author(s):  
W. Wan ◽  
J. Su ◽  
X. D. Zou ◽  
T. Willhammar
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Electron Diffraction ◽  
Electron Tomography ◽  
Structure Characterization ◽  
Transmission Electron ◽  
High Resolution Tem

This review presents various TEM techniques including electron diffraction, high-resolution TEM and scanning TEM imaging, and electron tomography and their applications for structure characterization of zeolite materials.

High Resolution Tem Studies of β-Alumina Type Structures

1983 ◽  
Vol 31 ◽  
Author(s):  
K. J. Morrissey ◽  
Z. Elgat ◽  
Y. Kouh ◽  
C. B. Carter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
Image Simulation ◽  
Commercial Alumina ◽  
Transmission Electron ◽  
Analytical Electron ◽  
High Resolution Tem ◽  
High Resolution Images

ABSTRACTHigh resolution transmission electron microscopy (HRTEM) has been used to study structures found in secondphase particles in commercial alumina compacts. Analytical electron microscopy has been used to identify elements present in the particles. Computer image simulation has been used for both the structural interpretation of high resolution images and predicting the effect which the presence of other elements would have on the observed structures.

Cross-Sectional Transmission Electron Microscopy of Si-Based Nanostructures

1996 ◽  
Vol 441 ◽  
Author(s):  
Maxim V. Sidorov ◽  
David J. Smith
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Single Electron ◽  
Single Electron Transistor ◽  
Cross Sectional ◽  
Transmission Electron ◽  
High Resolution Tem

AbstractThis work demonstrates the successful application of the precision cross-sectioning technique to the characterization of two types of Si-based nanostructures. Careful wedge-polishing of an array of metal-coated poly-Si microlines gave electron transparency over areas as broad as 1.5 mm across. A single, specific, SET (Single Electron Transistor), having dimensions of 4 × 4 μm2, was cross-sectioned for examination using conventional and high-resolution TEM imaging.

Application of high-resolution transmission electron microscopy and electron energy-loss spectroscopy in the characterization of polymer nanotubes

e-Polymers ◽  
2013 ◽  
Vol 13 (1) ◽  
Author(s):  
Lei Shang ◽  
Xiaoru Li ◽  
Yiqian Wang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Transmission Electron ◽  
Electron Energy Loss ◽  
Polymer Nanotubes

Abstract Polyamide 6 (PA6) and polystyrene (PS) nanotubes were successfully fabricated by polymer solution-wetting method. High-resolution transmission electron microscopy (HRTEM), X-ray diffraction (XRD) and electron energy-loss spectroscopy (EELS) techniques were employed to investigate their crystallization phenomena. It has been found in HRTEM images that the crystalline lattice fringes are observed in some regions of the nanotube walls. XRD analysis showed that these two kinds of polymer nanotubes have a higher degree of crystallinity than that of the bulk materials. PA6 nanotubes dominate in γ phase while bulk PA6 present mainly in α phase. EELS has been used to determine the ratio of C=C and C-C in PS nanotubes, and our result is consistent with the theoretical calculation. HRTEM and EELS will shed light on the microstructural characterization of polymer nanotubes.

High Resolution Transmission Electron Microscopy at Zero Cs

1998 ◽  
Vol 4 (S2) ◽  
pp. 382-383
Author(s):  
Michael A. O'Keefe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Transfer Functions ◽  
Spherical Aberration ◽  
Objective Lens ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Model Structures ◽  
Image Simulations

Now that correctors for objective lens spherical aberration are becoming feasible, questions have been raised about the usefulness of high-resolution transmission electron microscopy at zero Cs and the possible difficulties of interpretation of such images. In general, high resolution TEM images are interpreted either by comparison with simulations from model structures or by contrast transfer functions (CTFs) to determine the weight (and sense) of spatial contributions to images from corresponding diffracted beams. At zero Cs, HREM image simulations will work, but a projected charge density theory should be used (instead of CTF theory) to interpret images. Both theories use approximations; CTF theory relies on kinematic scattering and PCD theory on zero Cs and limited defocus.

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