TEM and STEM Electron Tomography Analysis of Amorphous Alloys CoP-CoNiP System

2012 ◽  
Vol 590 ◽  
pp. 9-12 ◽  
Author(s):  
Tamara Mekhantseva ◽  
Oleg Voitenko ◽  
Ilya Smirnov ◽  
Evgeny Pustovalov ◽  
Vladimir Plotnikov ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Amorphous Alloys ◽  
Electron Tomography ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
High Resolution Images ◽  
Electron Energy Loss ◽  
Tomography Analysis

This paper covers the analysis of amorphous alloys CoP-CoNiP system by means of high-resolution transmission electron microscopy (HRTEM), scanning transmission electron microscopy and electron tomography. The last years have seen a sufficient progress in the analysis of nanomaterials structure with the help of high resolution tomography. This progress was motivated by the development of microscopes equipped with aberration correctors and specialized sample holders which allow reaching the tilts angles up to ±80°. The opportunities delivered by the method of electron tomography sufficiently grow when producing high resolution images and using chemical analysis, such as X-Ray energy-dispersive microanalysis and electron energy loss spectroscopy (EELS).

Characterization of the (0110) α-Ti/γ-TiH Interface Using High-Resolution Transmission Electron Microscopy (TEM) and Electron Energy Loss Spectroscopy (EELS)

1996 ◽  
Vol 54 ◽  
pp. 108-109
Author(s):  
M. M. Tsai ◽  
J. M. Howe
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Hydrogen Atoms ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
High Resolution Images ◽  
Electron Energy Loss ◽  
Image Simulations

Precipitation of γ-TiH in α-Ti-H alloys involves a hcp → fct lattice transformation with hydrogen as an interstitial diffusing element Results obtained from a previous TEM study have shown that the lengthening rate of γ-TiH is diffusionally controlled at 25°C, and possibly interfacially controlled at temperatures of 50°C and higher. Therefore, it is essential to ascertain the presence or absence of hydrogen atoms at the interface. TEM foils from a 800 ppm wt.% Ti-H alloy were analyzed using high-resolution TEM and image simulations in order to determine the effects of hydrogen on high-resolution images of the α-Ti/γ-TiH interface, and EELS was used to determine the whether the hydnde structure was fully formed up to the interface.

Electron Energy-Loss Spectroscopy (EELS) of Fe-Bearing Olivine and Laihunite (an Oxidized Olivine)

2000 ◽  
Vol 6 (S2) ◽  
pp. 208-209
Author(s):  
Huifang Xu ◽  
Pingqiu Fu
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Structure Refinement ◽  
Iron Formation ◽  
Transmission Electron ◽  
Electron Energy Loss

Laihunite that has distorted olivine-type structure with ferric and ferrous irons and ordered distribution of vacancies was first discovered in a high-grade metamorphosed banded iron formation (BIF) [1, 2]. The laihunite coexisting with fayalite (Fe-olivine), magnetite, quartz, ferrosilite, garnet and hedenbergite, formed in the process of oxidation of fayalite [2, 3]. The structure refinement of 1-layer laihunite shows P21/b symmetry and ordered distribution of vacancies in half M1 sites of olivine structure [2, 3]. Early high-resolution transmission electron microscopy (HRTEM) study and HRTEM image simulation of the 1-layer laihunite verified the structure refinement [4].Specimens of weakly oxidized fayalite and laihunite containing fayalite islands collected from Xiaolaihe and Menjiagou of Liaoning Province, NE China, have been studied using selected area electron diffraction (SAED), high-resolution transmission electron microscopy (HRTEM), electron energy-loss spectroscopy (EELS), and X-ray energy-dispersive spectroscopy.

A Chemical and Structural Study of the AlN-Si Interface

1997 ◽  
Vol 468 ◽  
Author(s):  
R. Beye ◽  
T. George
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Chemical Interaction ◽  
Interfacial Phenomena ◽  
Peak Shape ◽  
Transmission Electron ◽  
Nitride Formation ◽  
Out Of Plane ◽  
Electron Energy Loss

AbstractSamples of AlN grown on silicon [111] substrates were examined using electron energy loss spectroscopy (EELS) and selected area diffraction (SAD) with high-resolution transmission electron microscopy (TEM) to determine the source of out-of-plane tilts and in-plane rotations of the AlN crystallites at the Si interface. SAD results indicate that the interfacial crystallites are sheared along vertical planes, with random, intercrystalline rotation. The interfacial phenomena are believed to be the result of Si-Al-N interaction. Analytical experiments show no evidence of silicon nitride formation, witnessed by nitrogen-K peak shape, up to the Si interface. No evidence of substrate-epilayer interdiffusion was observed. Chemical interaction within one monolayer of the interface is therefore suspected as the cause of the epilayer tilts and rotations.

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