Charging Effects on the Spectral Quality of X-ray Microanalysis Using the Variable Pressure Scanning Electron Microscope

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
J-F Le Berre ◽  
G Demopoulos ◽  
R Gauvin
2006 ◽  
Vol 12 (S02) ◽  
pp. 1492-1493 ◽  
Author(s):  
J-F Le Berre ◽  
K Robertson ◽  
R Gauvin ◽  
GP Demopoulos

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


2006 ◽  
Vol 304-305 ◽  
pp. 57-61
Author(s):  
L.L. Fang ◽  
Bing Lin Zhang ◽  
Ning Yao

In this paper, we report that the experimental results of fabricated diamond-metal composite film. Electrotyping method was used to deposit the thick film. During the deposition, low internal stress electrolytic solution, the electric current density of cathode, PH value, temperature, the distance between cathode and anode, the pretreatment of motherboard cathode were selected simultaneously. It was found that stirring strongly affected the quality of the film. Especially stirring velocity affected the distribution of diamond grains. Scanning electron microscope (SEM), X-ray photoemission spectroscopy (XPS) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure, diamond grains distribution and the chemical environment of the film.


Author(s):  
Joseph I. Goldstein ◽  
Dale E. Newbury ◽  
Joseph R. Michael ◽  
Nicholas W. M. Ritchie ◽  
John Henry J. Scott ◽  
...  

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