In-situ Scanning Transmission Electron Microscopy Study on the Microstructural Characterization of a TFT-LCD Panel by a FIB/SEM
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Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
2008 ◽
Vol 39
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pp. 950-953
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Vol 179
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pp. 1857-1863
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pp. 5358-5365
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pp. 3239-3246
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