Clustering and Local Magnification Effects in Atom Probe Tomography: A Statistical Approach

2010 ◽  
Vol 16 (5) ◽  
pp. 643-648 ◽  
Author(s):  
Thomas Philippe ◽  
Maria Gruber ◽  
François Vurpillot ◽  
D. Blavette
Keyword(s):  
Experimental Data ◽  
Atom Probe Tomography ◽  
Statistical Approach ◽  
Nearest Neighbor ◽  
Three Dimensional ◽  
Atom Probe ◽  
Quantitative Composition ◽  
Second Phase ◽  
Real Experimental Data ◽  
Open Issues

AbstractLocal magnification effects and trajectory overlaps related to the presence of a second phase (clusters) are key problems and still open issues in the assessment of quantitative composition data in three-dimensional atom probe tomography (APT) particularly for tiny solute-enriched clusters. A model based on the distribution of distance of first nearest neighbor atoms has been developed to exhibit the variations in the apparent atomic density in reconstructed volumes and to correct compositions that are biased by local magnification effects. This model was applied to both simulated APT reconstructions and real experimental data and shows an excellent agreement with the expected composition of clusters.

Lattice Rectification in Atom Probe Tomography: Toward True Three-Dimensional Atomic Microscopy

2011 ◽  
Vol 17 (2) ◽  
pp. 226-239 ◽  
Author(s):  
Michael P. Moody ◽  
Baptiste Gault ◽  
Leigh T. Stephenson ◽  
Ross K.W. Marceau ◽  
Rebecca C. Powles ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Nearest Neighbor ◽  
Three Dimensional ◽  
Positional Information ◽  
Atom Probe ◽  
Pure Metal ◽  
Distribution Functions ◽  
Al Alloy ◽  
Significant Step ◽  
Species Specific

AbstractAtom probe tomography (APT) represents a significant step toward atomic resolution microscopy, analytically imaging individual atoms with highly accurate, though imperfect, chemical identity and three-dimensional (3D) positional information. Here, a technique to retrieve crystallographic information from raw APT data and restore the lattice-specific atomic configuration of the original specimen is presented. This lattice rectification technique has been applied to a pure metal, W, and then to the analysis of a multicomponent Al alloy. Significantly, the atoms are located to their true lattice sites not by an averaging, but by triangulation of each particular atom detected in the 3D atom-by-atom reconstruction. Lattice rectification of raw APT reconstruction provides unprecedented detail as to the fundamental solute hierarchy of the solid solution. Atomic clustering has been recognized as important in affecting alloy behavior, such as for the Al-1.1Cu-1.7Mg (at. %) investigated here, which exhibits a remarkable rapid hardening reaction during the early stages of aging, linked to clustering of solutes. The technique has enabled lattice-site and species-specific radial distribution functions, nearest-neighbor analyses, and short-range order parameters, and we demonstrate a characterization of solute-clustering with unmatched sensitivity and precision.

scholarly journals High-Accuracy Sample Preparation for Three Dimensional Atom Probe Tomography Using Orthogonal Column Layout FIB-SEM and its STEM function

2018 ◽  
Vol 24 (S1) ◽  
pp. 830-831
Author(s):  
Miki Tsuchiya ◽  
Yoshihisa Orai ◽  
Takahiro Sato ◽  
Xin Man ◽  
Junichi Katane ◽  
...  
Keyword(s):  
Sample Preparation ◽  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
High Accuracy

Three-Dimensional Chemical Mapping of a Single Protein in the Hydrated State with Atom Probe Tomography

2020 ◽  
Vol 92 (7) ◽  
pp. 5168-5177 ◽  
Author(s):  
Shi Qiu ◽  
Changxi Zheng ◽  
Vivek Garg ◽  
Yu Chen ◽  
Gediminas Gervinskas ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
Chemical Mapping ◽  
Single Protein

Three-dimensional doping and diffusion in nano scaled devices as studied by atom probe tomography

2013 ◽  
Vol 24 (27) ◽  
pp. 275705 ◽  
Author(s):  
Ajay Kumar Kambham ◽  
Arul Kumar ◽  
Antonios Florakis ◽  
Wilfried Vandervorst
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
And Diffusion

Three-Dimensional Characterization of Deuterium Implanted in Silicon Using Atom Probe Tomography

2013 ◽  
Vol 6 (6) ◽  
pp. 066602 ◽  
Author(s):  
Hisashi Takamizawa ◽  
Katsuya Hoshi ◽  
Yasuo Shimizu ◽  
Fumiko Yano ◽  
Koji Inoue ◽  
...  
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe
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