Characterization of Healthy and Fluorotic Enamel by Atomic Force Microscopy

2010 ◽  
Vol 16 (5) ◽  
pp. 531-536 ◽  
Author(s):  
Verónica Zavala-Alonso ◽  
Gabriel A. Martínez-Castanon ◽  
Nuria Patiño-Marín ◽  
Humberto Terrones ◽  
Kenneth Anusavice ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Depth Profile ◽  
Positive Association ◽  
Clinical Findings ◽  
Mean Values ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean

AbstractThe aim was to characterize the external structure, roughness, and absolute depth profile (ADP) of fluorotic enamel compared with healthy enamel. Eighty extracted human molars were classified into four groups [TFI: 0, control (C); 1–3, mild (MI); 4–5, moderate (MO); 6–9, severe fluorosis (S)] according to the Thylstrup-Fejerskov Index (TFI). All samples were analyzed by atomic force microscopy.The mean values of enamel surface roughness (ESR) in nm were: Group C, 92.6; Group MI, 188.8; Group MO, 246.9; and Group S, 532.2. The mean values of absolute depth profile in nm were: C, 1,065.7; MI, 2,360.7; MO, 2,536.7; and S, 6,146.2. The differences between mean ESR and mean ADP among groups were statistically significant (p < 0.05). This structural study confirms at the nanometer level that there is a positive association between fluorosis severity, ESR, and ADP, and there is an association with the clinical findings of fluorosis measured by TFI as well.

Surface Roughness

2019 ◽  
pp. 28-53
Author(s):  
C. Mathew Mate ◽  
Robert W. Carpick
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Contact Friction ◽  
Radius Of Curvature ◽  
Roughness Parameters ◽  
Force Microscopy ◽  
Fractal Surfaces ◽  
Atomic Force ◽  
The Mean ◽  
Physical Phenomena

When two surfaces are brought into contact, they first touch where the summits of the surface asperities make contact. Consequently, surface roughness or topography strongly influences those physical phenomena associated with contact: friction, adhesion, and wear. This chapter discusses techniques for measuring the roughness of surfaces and the parameters frequently used to characterize this roughness. As atomic force microscopy (AFM) and optical interferometry are currently the predominant tools for characterizing roughness, these techniques are discussed at some length. Examples are given for determining not only the standard roughness parameters (the standard deviation of surface heights, the mean radius of curvature of asperity summits, waviness, and the average and rms of surface heights), but also for determining the surface roughness power spectrum, which has gained importance in recent tribology theories. The topography of self-affine fractal surfaces is also discussed along with the tribological importance of these surfaces.

scholarly journals Comparative effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding and composite resin removal: An atomic force microscopy

2019 ◽  
Vol 9 ◽  
pp. 223-229
Author(s):  
Faeze Qabel ◽  
Riehane Talaei ◽  
Saeedeh Saeedi ◽  
Raheb Ghorbani ◽  
Nazila Ameli
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Composite Resin ◽  
Cost Effective ◽  
Orthodontic Bracket ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean ◽  
Level Of Significance ◽  
One Way Anova

Purpose: Porcelain polishing after orthodontic bracket debonding and resin removal is imperative to eliminate surface roughness and minimize the risk of plaque accumulation, periodontal disease, and porcelain discoloration. This study aimed to assess the effect of three polishing systems on porcelain surface roughness after orthodontic bracket debonding. Materials and Methods: Thirty porcelain blocks were divided into three groups. Surface roughness of the samples was first measured using atomic force microscopy (AFM) and recorded as baseline. Orthodontic brackets were bonded to blocks by composite resin. After bracket debonding, resin remnants were removed by tungsten carbide bur. The blocks were then polished with Sof-Lex discs, Meisinger, and Jota porcelain polishing kit. Surface roughness was measured again using AFM. The Shapiro–Wilk test, one-way ANOVA, and Tukey’s post hoc test were used for data analysis through SPSS version 18.0. Level of significance was set at 5%. Results: The mean change in surface roughness after polishing with Jota kit (56.6 nm) was significantly greater than that compared to Sof-Lex discs (10.7 nm) (P = 0.003) and Meisinger kit (26.6 nm) (P = 0.024). The mean change in surface roughness was not significantly different between Sof-Lex and Meisinger groups. Surface roughness significantly increased in all three groups (P < 0.05). Conclusion: Meisinger polishing kit and Sof-Lex discs were not significantly different in terms of the resultant surface roughness. Thus, the conventional use of Sof-Lex discs seems to be more cost-effective due to their lower cost.

Surface Roughness Characterization of ZnO: TiO2-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

2014 ◽  
Vol 13 (03) ◽  
pp. 1450020 ◽  
Author(s):  
Ştefan Ţălu ◽  
Sebastian Stach ◽  
Muhammad Ikram ◽  
Dinesh Pathak ◽  
Tomas Wagner ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Fractal Analysis ◽  
Surface Characterization ◽  
Surface Characteristics ◽  
Statistical Parameters ◽  
Force Microscopy ◽  
Atomic Force

The objective of this work is to quantitatively characterize the 3D complexity of ZnO : TiO 2-organic blended solar cells layers by atomic force microscopy and fractal analysis. ZnO : TiO 2-organic blended solar cells layers were investigated by AFM in tapping-mode in air, on square areas of 25 μm2. A detailed methodology for ZnO : TiO 2-organic blended solar cells layers surface fractal characterization, which may be applied for AFM data, is presented. Detailed surface characterization of the surface topography was obtained using statistical parameters, according with ISO 25178-2: 2012. The fractal dimensions Df values (all with average ± standard deviation), obtained with morphological envelopes method, for: blend D1 ( P 3 HT : PCBM : ZnO : TiO 2 blend with ratio 1:0.35:0.175:0.175 mg in 1 ml of Chlorobenzene) is Df = 2.55 ± 0.01; and for blend D2 ( P 3 HT : PCBM : ZnO : TiO 2 blend with ratio 1:0.55:0.075:0.075 mg in 1 ml of Chlorobenzene) is Df = 2.45 ± 0.01. Denoting the ratios in 1 ml of Chlorobenzene with D1 and D2 articles. The 3D surface roughness of samples revealed a fractal structure at nanometer scale. Fractal and AFM analysis may assist manufacturers in developing ZnO : TiO 2-organic blended solar cells layers with better surface characteristics and provides different yet complementary information to that offered by traditional surface statistical parameters.

A COMPARISON BETWEEN THE ATOMIC FORCE MICROSCOPY AND X-RAY REFLECTIVITY ON THE CHARACTERIZATION OF SURFACE ROUGHNESS

2003 ◽  
Vol 02 (04n05) ◽  
pp. 343-348 ◽  
Author(s):  
CHIH-HAO LEE ◽  
WEN-YEN PEN ◽  
MING-ZHE LIN ◽  
KUAN-LI YU ◽  
JEN-CHUNG HSUEH
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Power Spectra ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent ◽  
Buried Layer

Atomic force microscopy and X-ray reflectivity methods are used to characterize a surface morphology which includes the information of rms roughness, roughness exponent, and the height–height correlation length. Two major reasons to interpret the discrepancy of rms roughness data measured by AFM and X-ray reflectivity are (1) the bandpass of power spectra density is different and (2) the X-ray reflectivity probes the high density buried layer.

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Brittle Behaviour in Aspirin Crystals: Evidence of Spalling Fracture

2020 ◽  
Author(s):  
Benjamin P. A. Gabriele ◽  
Craig J. Williams ◽  
Douglas Stauffer ◽  
Brian Derby ◽  
Aurora J. Cruz-Cabeza
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Single Crystals ◽  
Spalling Fracture ◽  
Force Microscopy ◽  
Atomic Force ◽  
Afm Imaging

<div> <div> <div> <p>Single crystals of aspirin form I were cleaved and indented on their dominant face. Upon inspection, it was possible to observe strongly anisotropic shallow lateral cracks due to the extreme low surface roughness after cleavage. Atomic Force Microscopy (AFM) imaging showed spalling fractures nucleating from the indent corners, forming terraces with a height of one or two interplanar spacings d100. The formation of such spalling fractures in aspirin was rationalised using basic calculations of attachment energies, showing how (100) layers are poorly bonded when compared to their relatively higher intralayer bonding. An attempt at explaining the preferential propagation of these fractures along the [010] direction is discussed. </p> </div> </div> </div>

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa
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