Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis
2013 ◽
Vol 25
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pp. 466-477
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2014 ◽
Vol 13
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pp. 1450020
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2012 ◽
Vol 51
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2010 ◽
Vol 16
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2011 ◽
Vol 11
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2012 ◽
Vol 258
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