Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps

A crystallographic treatment is developed which clarifies the relation between the structure of a grain boundary and its location between relatively translated crystals. Characterization of line defects which can exist in grain boundaries is also facilitated by using this treatment, and the following topics are considered: (1) the computed structures in part I of this work; (2) steps at the cores of perfect grain boundary dislocations; (3) boundary structures related by c.s.l. symmetry; (4) partial grain boundary dislocations. Transmission electron microscope observations of topic 4 are presented.

Download Full-text

Minor Special Issue on Corrosion. Transmission Electron Microscope Observation of Grain Boundary Precipitates in an Al-1mass% Mg2Si Alloy.

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.42.949 ◽

1993 ◽

Vol 42 (479) ◽

pp. 949-954 ◽

Cited By ~ 3

Author(s):

Susumu IKENO ◽

Masanobu UWANORI ◽

Masakazu ISURUGI ◽

Kenji MATSUDA ◽

Shizuo TADA ◽

...

Keyword(s):

Electron Microscope ◽

Grain Boundary ◽

Transmission Electron Microscope ◽

Microscope Observation ◽

Electron Microscope Observation ◽

Special Issue ◽

Transmission Electron Microscope Observation ◽

Transmission Electron

Download Full-text

Characterization of Li-rich layered oxides by using transmission electron microscope

Green Energy & Environment ◽

10.1016/j.gee.2017.05.005 ◽

2017 ◽

Vol 2 (3) ◽

pp. 174-185 ◽

Cited By ~ 5

Author(s):

Hu Zhao ◽

Bao Qiu ◽

Haocheng Guo ◽

Kai Jia ◽

Zhaoping Liu ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Layered Oxides ◽

Transmission Electron

Download Full-text

Characterization of JEOL 3000f TEM Equipped for Electron Holography

Microscopy and Microanalysis ◽

10.1017/s1431927600033638 ◽

2000 ◽

Vol 6 (S2) ◽

pp. 228-229

Author(s):

M. A. Schofield ◽

Y. Zhu

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Design Of Experiment ◽

Electron Holography ◽

Fringe Spacing ◽

Interference Fringes ◽

Transmission Electron ◽

Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

Download Full-text