Fabrication and In Situ Transmission Electron Microscope Characterization of Free-Standing Graphene Nanoribbon Devices

AbstractA system for illuminating a samplein situwith visible and ultraviolet light inside a transmission electron microscope was devised to study photocatalysts. There are many mechanical and optical factors that must be considered when designing and building such a system. Some of the restrictions posed by the electron microscope column are significant, and care must be taken not to degrade the microscope's electron-optical performance or to unduly restrict the other capabilities of the microscope. We discuss the nature of the design considerations, as well as the practical implementation and characterization of a solution. The system that has been added to an environmental transmission electron microscope includes a high brightness broadband light source with optical filters, a fiber to guide the light to the sample, and a mechanism for precisely aligning the fiber tip.

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Deformation mechanisms in free-standing nanoscale thin films: A quantitative in situ transmission electron microscope study

Proceedings of the National Academy of Sciences ◽

10.1073/pnas.0400066101 ◽

2004 ◽

Vol 101 (17) ◽

pp. 6335-6340 ◽

Cited By ~ 185

Author(s):

M. A. Haque ◽

M. T. A. Saif

Keyword(s):

Thin Films ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Microscope Study ◽

Electron Microscope Study ◽

Deformation Mechanisms ◽

Free Standing ◽

Transmission Electron ◽

Transmission Electron Microscope Study

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Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100164386 ◽

1996 ◽

Vol 54 ◽

pp. 384-385

Author(s):

M.A. O’Keefe ◽

J. Taylor ◽

D. Owen ◽

B. Crowley ◽

K.H. Westmacott ◽

...

Keyword(s):

Electron Microscopy ◽

Electron Microscope ◽

User Interface ◽

Transmission Electron Microscope ◽

High Voltage ◽

Materials Science ◽

Transmission Electron ◽

On Line ◽

Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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In situ observation of ordering process in FePt films during annealing in a transmission electron microscope

Journal of Applied Physics ◽

10.1063/1.2205408 ◽

2006 ◽

Vol 99 (12) ◽

pp. 123905 ◽

Cited By ~ 8

Author(s):

K. Kawai ◽

S. Honda ◽

M. Nawate ◽

M. Komatsu ◽

K. Kawabata

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

In Situ Observation ◽

Transmission Electron

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Characterization of Li-rich layered oxides by using transmission electron microscope

Green Energy & Environment ◽

10.1016/j.gee.2017.05.005 ◽

2017 ◽

Vol 2 (3) ◽

pp. 174-185 ◽

Cited By ~ 5

Author(s):

Hu Zhao ◽

Bao Qiu ◽

Haocheng Guo ◽

Kai Jia ◽

Zhaoping Liu ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Layered Oxides ◽

Transmission Electron

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Characterization of JEOL 3000f TEM Equipped for Electron Holography

Microscopy and Microanalysis ◽

10.1017/s1431927600033638 ◽

2000 ◽

Vol 6 (S2) ◽

pp. 228-229

Author(s):

M. A. Schofield ◽

Y. Zhu

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Design Of Experiment ◽

Electron Holography ◽

Fringe Spacing ◽

Interference Fringes ◽

Transmission Electron ◽

Careful Design

Quantitative off-axis electron holography in a transmission electron microscope (TEM) requires careful design of experiment specific to instrumental characteristics. For example, the spatial resolution desired for a particular holography experiment imposes requirements on the spacing of the interference fringes to be recorded. This fringe spacing depends upon the geometric configuration of the TEM/electron biprism system, which is experimentally fixed, but also upon the voltage applied to the biprism wire of the holography unit, which is experimentally adjustable. Hence, knowledge of the holographic interference fringe spacing as a function of applied voltage to the electron biprism is essential to the design of a specific holography experiment. Furthermore, additional instrumental parameters, such as the coherence and virtual size of the electron source, for example, affect the quality of recorded holograms through their effect on the contrast of the holographic fringes.

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