Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms

AbstractSingle atoms can be considered as the most basic objects for electron microscopy to test the microscope performance and basic concepts for modeling image contrast. In this work high-resolution transmission electron microscopy was applied to image single platinum, molybdenum, and titanium atoms in an aberration-corrected transmission electron microscope. The atoms are deposited on a self-assembled monolayer substrate that induces only negligible contrast. Single-atom contrast simulations were performed on the basis of Weickenmeier-Kohl and Doyle-Turner form factors. Experimental and simulated image intensities are in quantitative agreement on an absolute intensity scale, which is provided by the vacuum image intensity. This demonstrates that direct testing of basic properties such as form factors becomes feasible.

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Quantifying The Effects Of Amorphous Layers on Image Contrast Using Energy Filtered Transmission Electron Microscopy

MRS Proceedings ◽

10.1557/proc-354-495 ◽

1994 ◽

Vol 354 ◽

Cited By ~ 7

Author(s):

C. B. Boothroyd ◽

R. E. Dunin-borkowski ◽

W. M. Stobbs ◽

C. J. Humphreys

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Inelastic Scattering ◽

Carbon Film ◽

Absolute Intensity ◽

Atomic Level ◽

Intensity Scale ◽

Transmission Electron ◽

High Resolution Images

AbstractHigh resolution images of a block oxide, (Nb205)çi(W03)8, with and without a superposed carbon film are compared both energy filtered and including the inelastic scattering. The differences between the images are quantified on an absolute intensity scale and possible origins of the differences in atomic level contrast are assessed using multislice simulations.

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Preparation of Titanium Microgrids for Scanning Transmission Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100079139 ◽

1977 ◽

Vol 35 ◽

pp. 322-323

Author(s):

M.L. Collins ◽

N.W. Parker

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Scanning Transmission Electron Microscopy ◽

Single Atom ◽

Specimen Preparation ◽

Transmission Microscopy ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission

The ideal supporting microgrid for high resolution scanning transmission electron microscopy should be: 1) made of material of low atomic number, 2) uniformly flat for ease in focusing, 3) resistant to any treatments necessary for cleaning and specimen preparation, and 4) a good electrical and thermal conductor. In the past, microgrid supports have been made of fenestrated plastic films strengthened by carbon or metal coatings. While adequate for most work, they cannot be baked at temperatures greater than 50°C. which may be necessary in some cases to completely eliminate contamination for single atom imaging using the STEM. To provide a reliably non-contaminating substrate support for high resolution scanning transmission microscopy, we have developed a simple technique for the preparation of microgrids of titanium metal. As can be seen in table 1, titanium posesses many attractive features.

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Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy

Micron ◽

10.1016/j.micron.2014.07.010 ◽

2015 ◽

Vol 68 ◽

pp. 186-193 ◽

Cited By ~ 22

Author(s):

C. Kisielowski ◽

P. Specht ◽

S.M. Gygax ◽

B. Barton ◽

H.A. Calderon ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

High Resolution ◽

Single Atom ◽

Transmission Electron ◽

Atom Level

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A High Resolution Study of G.P. Zones in Aluminum - 4.2 at % Silver

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100055904 ◽

1982 ◽

Vol 40 ◽

pp. 722-723 ◽

Cited By ~ 1

Author(s):

R. Gronsky

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Computer Simulations ◽

Structural Characteristics ◽

X Ray Diffraction ◽

X Ray ◽

Transmission Electron ◽

Resolution Study

The phenomenon of clustering in Al-Ag alloys has been extensively studied since the early work of Guinierl, wherein the pre-precipitation state was characterized as an assembly of spherical, ordered, silver-rich G.P. zones. Subsequent x-ray and TEM investigations yielded results in general agreement with this model. However, serious discrepancies were later revealed by the detailed x-ray diffraction - based computer simulations of Gragg and Cohen, i.e., the silver-rich clusters were instead octahedral in shape and fully disordered, atleast below 170°C. The object of the present investigation is to examine directly the structural characteristics of G.P. zones in Al-Ag by high resolution transmission electron microscopy.

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