scholarly journals 3D Microstructure Characterization of a Silicon Based Anode Material on Different Length Scales suitable for Storage Applications

2019 ◽  
Vol 25 (S2) ◽  
pp. 356-357
Author(s):  
T. Vorauer ◽  
P. Kumar ◽  
F. F. Chamasemani ◽  
J. Rosc ◽  
B. Fuchsbichler ◽  
...  
2000 ◽  
Vol 609 ◽  
Author(s):  
Wolfhard Beyer ◽  
Sergio S. Camargo ◽  
Rosari Saleh

ABSTRACTIt is shown that inert gas effusion employing implanted neon and argon atoms is a useful tool for microstructure characterization of a-Si based alloys. The method measures sensitively interconnected voids and gives information about sizes of microstructure. Limitations of the method are discussed. The results show network reconstruction effects in a-Si:O:H and a-Si:C:H alloys as a function of annealing.


2011 ◽  
Vol 192 (1) ◽  
pp. 330-334 ◽  
Author(s):  
Xiuyan Wang ◽  
Zhaoyin Wen ◽  
Yu Liu ◽  
Ying Huang ◽  
Ting-Lian Wen

2014 ◽  
Vol 20 (S3) ◽  
pp. 956-957
Author(s):  
Michael Engstler ◽  
Jenifer Barrirero ◽  
Naureen Ghafoor ◽  
Magnus Odén ◽  
Frank Mücklich

2020 ◽  
Vol 11 (3) ◽  
pp. 364-364
Author(s):  
Maciej Ratynski ◽  
Bartosz Hamankiewicz ◽  
Michał Krajewski ◽  
Maciej Boczar ◽  
Dominika A. Buchberger ◽  
...  

2000 ◽  
Vol 313 (1-2) ◽  
pp. 154-160 ◽  
Author(s):  
Héctor J. Dorantes-Rosales ◽  
Vı́ctor M. López-Hirata ◽  
José L. Méndez-Velázquez ◽  
Maribel L. Saucedo-Muñoz ◽  
David Hernández-Silva

2009 ◽  
Vol 16 (1) ◽  
pp. 1-10 ◽  
Author(s):  
C. Wilhelm ◽  
G. LaCaille ◽  
N. Wright ◽  
N. Ward ◽  
C. Shu ◽  
...  

2006 ◽  
Vol 153 (2) ◽  
pp. 375-379 ◽  
Author(s):  
Masaki Yoshio ◽  
Satoshi Kugino ◽  
Nikolay Dimov

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