scholarly journals Development of Mega-electron-volt Ultrafast Electron Diffraction at SLAC National Accelerator Laboratory – Towards a Multifunctional Platform for Ultrafast Science

2020 ◽  
Vol 26 (S2) ◽  
pp. 208-209
Author(s):  
Xiaozhe Shen ◽  
Fuhao Ji ◽  
Kozina Michael ◽  
Duan Luo ◽  
Ming-Fu Lin ◽  
...  
Author(s):  
Joao Pedro Figueira Nunes ◽  
Kathryn Ledbetter ◽  
Ming-Fu Lin ◽  
Michael Kozina ◽  
Elisa Biasin ◽  
...  

2019 ◽  
Vol 6 (5) ◽  
pp. 054305 ◽  
Author(s):  
X. Shen ◽  
J. P. F. Nunes ◽  
J. Yang ◽  
R. K. Jobe ◽  
R. K. Li ◽  
...  

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Xi Yang ◽  
Junjie Li ◽  
Mikhail Fedurin ◽  
Victor Smaluk ◽  
Lihua Yu ◽  
...  

AbstractA real-time, nondestructive, Bragg-diffracted electron beam energy, energy-spread and spatial-pointing jitter monitor is experimentally verified by encoding the electron beam energy and spatial-pointing jitter information into the mega-electron-volt ultrafast electron diffraction pattern. The shot-to-shot fluctuation of the diffraction pattern is then decomposed to two basic modes, i.e., the distance between the Bragg peaks as well as its variation (radial mode) and the overall lateral shift of the whole pattern (drift mode). Since these two modes are completely decoupled, the Bragg-diffraction method can simultaneously measure the shot-to-shot energy fluctuation from the radial mode with 2·10−4 precision and spatial-pointing jitter from the drift mode having wide measurement span covering energy jitter range from 10−4 to 10−1. The key advantage of this method is that it allows us to extract the electron beam energy spread concurrently with the ongoing experiment and enables online optimization of the electron beam especially for future high charge single-shot ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) experiments. Furthermore, real-time energy measurement enables the filtering process to remove off-energy shots, improving the resolution of time-resolved UED. As a result, this method can be applied to the entire UED user community, beyond the traditional electron beam diagnostics of accelerators used by accelerator physicists.


2018 ◽  
Vol 13 (06) ◽  
pp. P06014-P06014 ◽  
Author(s):  
B.K. Ofori-Okai ◽  
M.C. Hoffmann ◽  
A.H. Reid ◽  
S. Edstrom ◽  
R.K. Jobe ◽  
...  

2020 ◽  
Vol 7 (2) ◽  
pp. 024301 ◽  
Author(s):  
J. P. F. Nunes ◽  
K. Ledbetter ◽  
M. Lin ◽  
M. Kozina ◽  
D. P. DePonte ◽  
...  

2015 ◽  
Vol 86 (7) ◽  
pp. 073702 ◽  
Author(s):  
S. P. Weathersby ◽  
G. Brown ◽  
M. Centurion ◽  
T. F. Chase ◽  
R. Coffee ◽  
...  

2009 ◽  
Vol 15 (4) ◽  
pp. 271-271 ◽  
Author(s):  
Mitra L. Taheri ◽  
Nigel D. Browning ◽  
John Lewellen

Dynamic characterization techniques have been utilized in the fields of biology, chemistry, physics, and materials science for many years. Techniques range from neutron scattering to X-ray diffraction. Two of the fields experiencing much development recently have been electron-based techniques. Namely, ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) have been advancing rapidly, but unfortunately, in parallel. We are approaching an era where the convergence of these two techniques could open up a wide range of scientific and technological opportunities and advancements.


2021 ◽  
Vol 15 (2) ◽  
pp. 2170013
Author(s):  
Junho Shin ◽  
Hyun Woo Kim ◽  
In Hyung Baek ◽  
Sunjeong Park ◽  
Hyeon Sang Bark ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document