scholarly journals Characterization of Intermetallic Precipitates Observed in 7XXX Series Aluminum Alloys Containing Manganese Using Aberration Corrected STEM

2021 ◽  
Vol 27 (S1) ◽  
pp. 1786-1786
Author(s):  
Robert E A Williams
Keyword(s):  
Aluminum Alloys ◽  
Intermetallic Precipitates ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Characterization of Gold on Silicon Nanowires using Aberration-corrected STEM

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
SH Oh ◽  
K van Benthem ◽  
SI Molina ◽  
P Werner ◽  
D Kumar ◽  
...  
Keyword(s):  
Silicon Nanowires ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM

2015 ◽  
Vol 21 (S3) ◽  
pp. 1305-1306
Author(s):  
HsinWei Wu ◽  
Toshihiro Aoki ◽  
Agham B. Posadas ◽  
Alexander A. Demkov ◽  
David J. Smith
Keyword(s):  
Cross Sectional ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

Nanoscale Chemical and Structural Characterization of Transient Metallic Nanowires using Aberration-Corrected STEM-EELS

Nano Letters ◽  
2012 ◽  
Vol 12 (6) ◽  
pp. 2732-2739 ◽  
Author(s):  
Santhana K. Eswara Moorthy ◽  
Olivier Rousseau ◽  
Michel Viret ◽  
Mathieu Kociak
Keyword(s):  
Structural Characterization ◽  
Metallic Nanowires ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals The Role of Aberration-Corrected STEM in the Characterization of Oxide Cathode Materials

2015 ◽  
Vol 21 (S3) ◽  
pp. 1547-1548
Author(s):  
P.J. Phillips ◽  
D.P. Abraham ◽  
J. Bareno ◽  
C. Kim ◽  
T. Yi ◽  
...  
Keyword(s):  
Cathode Materials ◽  
Oxide Cathode ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Three Dimensional Characterization of Interfaces using Aberration-corrected STEM

2005 ◽  
Vol 11 (S02) ◽  
Author(s):  
K van Benthem ◽  
A Y Borisevich ◽  
M F Chisholm ◽  
A R Lupini ◽  
S T Pantelides ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Aberration Corrected Stem ◽  
Aberration Corrected

scholarly journals Atomic Scale Characterization of LSFMO Thin Films Using Aberration Corrected STEM

2010 ◽  
Vol 16 (S2) ◽  
pp. 146-147
Author(s):  
M Gu ◽  
Y Takamura ◽  
ND Browning
Keyword(s):  
Thin Films ◽  
Atomic Scale ◽  
Aberration Corrected Stem ◽  
Scale Characterization ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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