The Life and Achievements of Raymond Castaing

Kurt F.J. Heinrich

doi:10.1017/s1431927698210506

The Life and Achievements of Raymond Castaing

Microscopy and Microanalysis ◽

10.1017/s1431927698210506 ◽

1998 ◽

Vol 4 (5) ◽

pp. 517-517

Author(s):

Kurt F.J. Heinrich

Keyword(s):

Materials Characterization ◽

Physical Research ◽

Science Management

The father of instrumental microanalysis, Raymond Castaing, died on April 10, 1998. With him, we lost one of the outstanding figures in modern materials characterization. He was creative and innovative in physical research, in invention of instruments, in teaching, and in science management. At a time when science tends toward an inexorable division into smaller and more specialized provinces, an investigator of truly wide-ranging interests and capabilities, in the best traditions of renaissance curiosity, has left us.

Download Full-text

Elemental Distribution in Pt-Re:Al2O3 Naphtha Reforming Catalysts

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s1431927600000866 ◽

1980 ◽

Vol 38 ◽

pp. 200-201

Author(s):

R. L. Freed ◽

M. J. Kelley

Keyword(s):

Bimetallic Catalyst ◽

Supported Catalysts ◽

Coke Formation ◽

Materials Characterization ◽

Metal Catalyst ◽

Elemental Distribution ◽

Exact Nature ◽

Naphtha Reforming ◽

Reforming Catalysts ◽

Commercial Introduction

The commercial introduction of Pt-Re supported catalysts to replace Pt alone on Al2O3 has brought improvements to naphtha reforming. The bimetallic catalyst can be operated continuously under conditions which lead to deactivation of the single metal catalyst by coke formation. Much disagreement still exists as to the exact nature of the bimetallic catalyst at a microscopic level and how it functions in the process so successfully. The overall purpose of this study was to develop the materials characterization tools necessary to study supported catalysts. Specifically with the Pt-Re:Al2O3 catalyst, we sought to elucidate the elemental distribution on the catalyst.

Download Full-text

Recent Advances in Materials Characterization and Modeling of Pavement Systems

10.1061/9780784407097 ◽

2003 ◽

Keyword(s):

Materials Characterization ◽

Recent Advances

Download Full-text

Fifty years of science-management cooperation from the SILVAH community of practice

10.2737/nrs-gtr-p-186-paper2 ◽

2019 ◽

pp. 8

Author(s):

Susan L. Stout ◽

Patrick H. Brose ◽

Helene Cleveland ◽

Robert P. Long ◽

Barbara McGuinness ◽

...

Keyword(s):

Community Of Practice ◽

Science Management

Download Full-text

Salton Sea Scientific Drilling Project; on-site science management; California

Open-File Report ◽

10.3133/ofr86397 ◽

1986 ◽

Author(s):

J.H. Sass ◽

S.S. Priest ◽

L.C. Robison ◽

J.D. Hendricks

Keyword(s):

Salton Sea ◽

Scientific Drilling ◽

Science Management ◽

Drilling Project

Download Full-text

Nanomechanical Characterization in the FIB

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0209 ◽

2005 ◽

Author(s):

Thomas M. Moore

Keyword(s):

Focused Ion Beam ◽

Ion Beam ◽

Materials Characterization ◽

Depth Of Focus ◽

Ion Milling ◽

Nano Technology ◽

Physical Behavior ◽

Nanomechanical Testing ◽

Load Cells ◽

Scanning Electron

Abstract The availability of the focused ion beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability has made it an appealing platform for materials characterization at the sub-micron, or "nano" level. This article focuses on nanomechanical characterization in the FIB, which is an extension of the FIB capabilities into the realm of nano-technology. It presents examples that demonstrate the power and flexibility of nanomechanical testing in the FIB or scanning electron microscope with a probe shaft that includes a built-in strain gauge. Loads that range from grams to micrograms are achievable. Calibration is limited only by the availability of calibrated load cells in the smallest load ranges. Deflections in the range of a few nanometers range can be accurately applied. Simultaneous electrical, mechanical, and visual data can be combined to provide a revealing study of physical behavior of complex and dynamic nanostructures.

Download Full-text