Development of a 200kV Atomic Resolution Analytical Electron Microscope

2009 ◽  
Vol 17 (3) ◽  
pp. 8-11 ◽  
Author(s):  
T. Isabell ◽  
J. Brink ◽  
M. Kawasaki ◽  
B. Armbruster ◽  
I. Ishikawa ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Atomic Structure ◽  
Spherical Aberration ◽  
Atomic Level ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Few electron optical inventions have revolutionized the TEM/ STEM as profoundly as the spherical aberration (Cs) corrector has. Characterization of technologically important materials increasingly needs to be done at the atomic or even sub-atomic level. This characterization includes determination of atomic structure as well as structural chemistry. With Cs correctors, the sub-Angstrom imaging barrier has been passed, and fast atomic scale spectroscopy is possible. In addition to improvements in resolution, Cs correctors offer a number of other significant improvements and benefits.

Atomic resolution AEM (ARAEM) of oxide superconductors

1992 ◽  
Vol 50 (1) ◽  
pp. 74-75
Author(s):  
Vinayak P. Dravid ◽  
H. Zhang ◽  
L.D. Marks ◽  
J.P. Zhang
Keyword(s):  
Electron Microscope ◽  
Field Emission ◽  
Atomic Resolution ◽  
Oxide Superconductors ◽  
Electron Holography ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Point To Point ◽  
Single Instrument ◽  
Better Than

A 200 kV cold field emission gun atomic resolution analytical electron microscope (ARAEM, Hitachi HF-2000) has been recently installed at Northwestern. The ARAEM offers an unprecedented combination of atomic structure imaging of better than 0.20 nm nominal point-to-point resolution and about 0.10 nm line resolution, alongwith nanoscale analytical capabilities and electron holography in one single instrument. The ARAEM has been fully functional/operational and this paper presents some illustrative examples of application of ARAEM techniques to oxide superconductors. Additional results will be presented at the meeting.

scholarly journals FEI Titan 80-300 TEM

2016 ◽  
Vol 2 ◽  
Author(s):  
Andreas Thust ◽  
Juri Barthel ◽  
Karsten Tillmann
Keyword(s):  
Electron Microscope ◽  
Solid State ◽  
Spherical Aberration ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Lens System ◽  
Stage Design ◽  
Precise Positioning ◽  
Transmission Electron ◽  
Wide Range

The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (<em>C</em><sub>S</sub>) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image <em>C</em><sub>S</sub>-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera.

Characterization of some welding fumes by an analytical electron microscope

1984 ◽  
Vol 13 (4) ◽  
pp. 419-420
Author(s):  
Aale Grekula ◽  
Raija Peura ◽  
SeppoJ. Sevonen
Keyword(s):  
Electron Microscope ◽  
Welding Fumes ◽  
Analytical Electron ◽  
Analytical Electron Microscope

scholarly journals Characterization of Ni-base Superalloys on the Atomic Scale by Atom Probe Tomography and Spherical-Aberration Corrected Analytical Electron Microscopy Techniques

2006 ◽  
Vol 12 (S02) ◽  
pp. 534-535 ◽  
Author(s):  
M Watanabe ◽  
D Saxey ◽  
R Zheng ◽  
D Williams ◽  
S Ringer
Keyword(s):  
Electron Microscopy ◽  
Atom Probe Tomography ◽  
Spherical Aberration ◽  
Analytical Electron Microscopy ◽  
Atom Probe ◽  
Atomic Scale ◽  
Analytical Electron ◽  
Microscopy Techniques ◽  
Aberration Corrected

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

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