Direct analysis of thin-layer chromatography spots by diffuse reflectance Fourier transform infrared spectrometry

1984 ◽  
Vol 56 (14) ◽  
pp. 2935-2939 ◽  
Author(s):  
Gary E. Zuber ◽  
Richard J. Warren ◽  
Peter P. Begosh ◽  
Ellen L. O'Donnell
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