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Analytical applications of x-ray excited optical luminescence. Direct determination of rare earth nuclear poisons in zirconia
Analytical Chemistry
◽
10.1021/ac60344a022
◽
1974
◽
Vol 46
(8)
◽
pp. 996-999
◽
Cited By ~ 9
Author(s):
Arthur P. D'Silva
◽
Velmer A. Fassel
Keyword(s):
Rare Earth
◽
Direct Determination
◽
X Ray
◽
Analytical Applications
◽
Optical Luminescence
Download Full-text
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References
Analytical applications of x-ray excited optical fluorescence spectra. Direct determination of fractional parts per million amounts of rare earths in thorium
Analytical Chemistry
◽
10.1021/ac60285a013
◽
1970
◽
Vol 42
(3)
◽
pp. 325-329
◽
Cited By ~ 27
Author(s):
T. R. Saranathan
◽
V. A. Fassel
◽
E. L. DeKalb
Keyword(s):
Rare Earths
◽
Fluorescence Spectra
◽
Direct Determination
◽
X Ray
◽
Analytical Applications
◽
Optical Fluorescence
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Determination of trace rare earth impurities in lutetium by x-ray excited optical luminescence
10.2172/4264082
◽
1974
◽
Author(s):
John Scott Tritten
Keyword(s):
Rare Earth
◽
X Ray
◽
Optical Luminescence
◽
Rare Earth Impurities
Download Full-text
USE OF A PORTABLE X-RAY FLUORESCENCE DETECTOR FOR DETERMINATION OF RARE EARTH ELEMENTS IN COAL BYPRODUCTS
10.1130/abs/2016am-286373
◽
2016
◽
Author(s):
Elliot Roth
◽
◽
Tracy L. Bank
◽
Emma Keegan
◽
Evan Granite
Keyword(s):
Rare Earth
◽
Rare Earth Elements
◽
Fluorescence Detector
◽
X Ray
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Determination of uranium in ores by an x-ray excited optical luminescence technique
Analytical Chemistry
◽
10.1021/ac50012a033
◽
1977
◽
Vol 49
(4)
◽
pp. 638-641
◽
Cited By ~ 5
Author(s):
Arthur P. D'Silva
◽
Velmer A. Fassel
Keyword(s):
X Ray
◽
Optical Luminescence
Download Full-text
Direct determination of the wave field of an x-ray nanobeam
Physical Review A
◽
10.1103/physreva.77.015812
◽
2008
◽
Vol 77
(1)
◽
Cited By ~ 34
Author(s):
Hidekazu Mimura
◽
Hirokatsu Yumoto
◽
Satoshi Matsuyama
◽
Soichiro Handa
◽
Takashi Kimura
◽
...
Keyword(s):
Wave Field
◽
Direct Determination
◽
X Ray
Download Full-text
Direct determination of metallic impurities in nuclear-grade boron carbide by slurry sampling total reflection X-ray fluorescence spectrometry and ICP atomic emission spectrometry subsequent to ultra-high-pressure sample digestion
Journal of the Iranian Chemical Society
◽
10.1007/s13738-021-02332-7
◽
2021
◽
Author(s):
Jian Yuan
◽
Shuo Feng
◽
Jianyong Cui
◽
Shouhua Sun
◽
Apeng Yu
◽
...
Keyword(s):
Direct Determination
◽
Atomic Emission
◽
Total Reflection
◽
Atomic Emission Spectrometry
◽
Emission Spectrometry
◽
Sample Digestion
◽
X Ray
◽
Ultra High Pressure
◽
Metallic Impurities
Download Full-text
Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method
Japanese Journal of Applied Physics
◽
10.1143/jjap.26.157
◽
1987
◽
Vol 26
(Part 1, No. 1)
◽
pp. 157-161
◽
Cited By ~ 3
Author(s):
Osamu Nittono
◽
Yoshihiro Sadamoto
◽
Sheng Kai Gong
Keyword(s):
Direct Determination
◽
X Ray Diffraction
◽
X Ray
◽
Sputtered Films
◽
Stress Levels
Download Full-text
The Direct Determination of Vanadium and Nickel in Crude Oils by X-Ray Fluorescence
Advances in X-Ray Analysis
◽
10.1007/978-1-4684-7401-5_10
◽
1960
◽
pp. 131-137
◽
Cited By ~ 2
Author(s):
Victoria R. Lopp
◽
C. G. Claypool
Keyword(s):
Direct Determination
◽
Crude Oils
◽
X Ray
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Direct Determination of the Au(110) Reconstructed Surface by X-Ray Diffraction
Physical Review Letters
◽
10.1103/physrevlett.50.1145
◽
1983
◽
Vol 50
(15)
◽
pp. 1145-1148
◽
Cited By ~ 264
Author(s):
I. K. Robinson
Keyword(s):
Direct Determination
◽
X Ray Diffraction
◽
X Ray
◽
Reconstructed Surface
Download Full-text
Determination of the relative concentrations of rare earth ions by x-ray absorption spectroscopy: Application to terbium mixed oxides
Journal of Physics and Chemistry of Solids
◽
10.1016/0022-3697(86)90033-8
◽
1986
◽
Vol 47
(4)
◽
pp. 413-416
◽
Cited By ~ 11
Author(s):
G. van der Laan
◽
J.C. fuggle
◽
M.P. van Dijk
◽
A.J. Burggraaf
◽
J.-M. Esteva
◽
...
Keyword(s):
Rare Earth
◽
Absorption Spectroscopy
◽
Mixed Oxides
◽
Rare Earth Ions
◽
X Ray
◽
X Ray Absorption
Download Full-text
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