Direct Determination of Stress Levels in Sputtered Films by means of X-Ray Diffraction Topographic Method

A direct method for determining powder diffraction data from a range of depths is described, where the linear absorption coefficient may vary with depth. A series of traditional data collections with varying angles of incidence are required, and the X-ray diffraction data arising from specific depths will be calculated by the transformation of these measured, angle-dependent spectra. These may then be analysed using any conventional method in order to gain information about characteristics of the sample in question at specific depths. Regularisation techniques have been used to solve the governing Fredholm integral equation to determine the depth-dependent diffractograms. The method has been validated by the use of simulated data having known model profiles, and has also been applied to experimental data from polycrystalline thin film samples.

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Direct Determination of the Structure of Barium Stearate Multilayers by X-Ray Diffraction

Biophysical Journal ◽

10.1016/s0006-3495(72)86078-8 ◽

1972 ◽

Vol 12 (2) ◽

pp. 175-190 ◽

Cited By ~ 39

Author(s):

W. Lesslauer ◽

J.K. Blasie

Keyword(s):

Direct Determination ◽

X Ray Diffraction ◽

X Ray ◽

Barium Stearate

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Direct observation of elastic displacement modes by grazing-incidence X-ray diffraction

Journal of Applied Crystallography ◽

10.1107/s0021889807034115 ◽

2007 ◽

Vol 40 (5) ◽

pp. 874-882 ◽

Cited By ~ 12

Author(s):

Geoffroy Prévot ◽

Alessandro Coati ◽

Bernard Croset ◽

Yves Garreau

Keyword(s):

Direct Determination ◽

Grazing Incidence ◽

Elastic Displacement ◽

Force Distribution ◽

X Ray Diffraction ◽

Vicinal Surfaces ◽

Electronic Density ◽

X Ray ◽

Self Organized

It is demonstrated that grazing-incidence X-ray diffraction is a direct tool for measuring the elastic displacement modes near the surface of a crystal. Due to the fact that X-ray diffraction is a Fourier transform of the electronic density, and thus, of the atomic positions, elastic displacement modes appear as additional spots in the reciprocal space. Their characteristics can be directly derived from the elastic constants of the material. Measuring the amplitude of the diffracted wave for these peaks allows direct determination of the force distribution at the surface, which is at the origin of the elastic displacements. Various examples of such determinations are given for self-organized surfaces and for vicinal surfaces.

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Structural Inhomogeneities Of SiO2 Quartz Gláss

MRS Proceedings ◽

10.1557/proc-105-187 ◽

1987 ◽

Vol 105 ◽

Author(s):

Zenon Bochyński

Keyword(s):

Amorphous Materials ◽

Structural Parameters ◽

Direct Determination ◽

Great Success ◽

X Ray Diffraction ◽

Crystalline Materials ◽

X Ray ◽

Accuracy Of Results ◽

Inorganic Glasses

AbstractTill now the only effective method of direct determination of structural parameters has been X-ray diffraction structural analysis. This method applied to crystalline materials has proved a great success and applied to noncrystalline substances like for example inorganic glasses, is becoming more and more successful.Beginning with the W. Ostwald proposition /1913/ carried out by W. Friedrich /1913/ and P. Debye /1915/ through the papers by B.E. Warren et al. /1934–1942/ or by E.A. Poray-Koshits et al. /1934–1942/ till the most recently published papers devoted to structural studies of noncrystalline /amorphous/ materials we follow a significant progress in technology and methodology of these studies.The resulting significant improvement to the accuracy of results yields much more accurate structural models of non-crystalline materials.

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Direct determination of microstructural parameters from the X-ray diffraction profile of a crystal with stacking faults

Journal of Applied Crystallography ◽

10.1107/s0021889801014091 ◽

2001 ◽

Vol 34 (6) ◽

pp. 730-736 ◽

Cited By ~ 24

Author(s):

Ernesto Estevez-Rams ◽

Arbelio Penton-Madrigal ◽

Raymundo Lora-Serrano ◽

Jorge Martinez-Garcia

Keyword(s):

Direct Determination ◽

Direct Solution ◽

X Ray Diffraction ◽

Step Size ◽

Diffraction Profile ◽

X Ray ◽

Microstructural Parameters ◽

Series Development ◽

Influence Of Noise

The practical aspects of a recently deduced formalism for the direct solution of the powder diffraction pattern of a layer crystal are addressed. It is shown that the obtained solution is particularly well suited to combination with a deconvolution procedure based on a series development of the peak profile. The influence of noise and step size on the obtained solution is discussed. Computer simulation is used to assess the robustness of the proposed procedure. The developed procedure is applied to a powder sample of Y2Co17that is affected by planar disorder.

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