Sequential Monitoring of Film Thickness Variations with Surface Plasmon Resonance Imaging and Imaging Ellipsometry Constructed with a Single Optical System

2008 ◽  
Vol 80 (3) ◽  
pp. 891-897 ◽  
Author(s):  
Yong-Jun Li ◽  
Yi Zhang ◽  
Feimeng Zhou
2017 ◽  
Vol 24 (2) ◽  
pp. 156-164 ◽  
Author(s):  
Kouki Ichihashi ◽  
Tomoyuki Maehara ◽  
Yasuhiro Mizutani ◽  
Tetsuo Iwata

2006 ◽  
Vol 4 (4) ◽  
pp. 610 ◽  
Author(s):  
Roberta D'Agata ◽  
Giulia Grasso ◽  
Giuseppe Iacono ◽  
Giuseppe Spoto ◽  
Graziella Vecchio

2009 ◽  
Vol 81 (5) ◽  
pp. 1957-1963 ◽  
Author(s):  
Ganeshram Krishnamoorthy ◽  
Edwin T. Carlen ◽  
Dietrich Kohlheyer ◽  
Richard B. M. Schasfoort ◽  
Albert van den Berg

2008 ◽  
Vol 47 (30) ◽  
pp. 5616 ◽  
Author(s):  
Le Liu ◽  
Yonghong He ◽  
Ying Zhang ◽  
Suihua Ma ◽  
Hui Ma ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document