scholarly journals Determination of Hexavalent Chromium Fractions in Plastics Using Laboratory-Based, High-Resolution X-ray Emission Spectroscopy

2018 ◽  
Vol 90 (11) ◽  
pp. 6587-6593 ◽  
Author(s):  
Evan P. Jahrman ◽  
Gerald T. Seidler ◽  
John R. Sieber
Keyword(s):  
High Resolution ◽  
Hexavalent Chromium ◽  
Emission Spectroscopy ◽  
X Ray

High Resolution X-Ray Fluorescence Si Kβ Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts

1988 ◽  
Vol 32 ◽  
pp. 177-183
Author(s):  
J Purton ◽  
D S Urch ◽  
N G West
Keyword(s):  
High Resolution ◽  
Emission Spectroscopy ◽  
New Method ◽  
Computer Programme ◽  
Airborne Dust ◽  
X Ray ◽  
Free Silica

AbstractHigh resolution x-ray emission spectroscopy (HRXES) has been used to record the Si Kβ spectra of a variety of minerals. Distinct changes in peak profile can be related to mineral typo. Representatives spectra were chosen and incorporated, into a computer programme to allow the determination of free silica in binary and quaternary mixtures. The potential of HRXES for the analysis of airborne dust samples is discussed.

Triosmium Clusters on a Support: Determination of Structure by X-ray Absorption Spectroscopy and High-Resolution Microscopy

2010 ◽  
Vol 17 (3) ◽  
pp. 1000-1008 ◽  
Author(s):  
Shareghe Mehraeen ◽  
Apoorva Kulkarni ◽  
Miaofang Chi ◽  
Bryan W. Reed ◽  
Norihiko L. Okamoto ◽  
...  
Keyword(s):  
High Resolution ◽  
Absorption Spectroscopy ◽  
Triosmium Clusters ◽  
X Ray ◽  
X Ray Absorption ◽  
High Resolution Microscopy

ANALYSIS OF SOLDERS ON TIN AND LEAD BASES BY X-RAY FLOORESCENT SPECTROSCOPY

2021 ◽  
pp. 124-131
Author(s):  
A.V. Alekseev ◽  
◽  
G.V. Orlov ◽  
P.S. Petrov ◽  
A.V. Slavin ◽  
...  
Keyword(s):  
Emission Spectroscopy ◽  
High Resolution Mass Spectrometry ◽  
Analytical Signal ◽  
Atomic Emission ◽  
Standard Samples ◽  
X Ray ◽  
Fundamental Parameters ◽  
The Matrix ◽  
Resolution Mass

The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.

scholarly journals 3P-094 High resolution and precise X-ray crystal structure determination of Cyctochrome c Oxidase(The 46th Annual Meeting of the Biophysical Society of Japan)

2008 ◽  
Vol 48 (supplement) ◽  
pp. S142
Author(s):  
Michihiro Suga ◽  
Kyoko Ito-Shinzawa ◽  
Hiroshi Aoyama ◽  
Kazumasa Muramoto ◽  
Eiki Yamashita ◽  
...  
Keyword(s):  
Crystal Structure ◽  
High Resolution ◽  
Annual Meeting ◽  
Structure Determination ◽  
Crystal Structure Determination ◽  
X Ray ◽  
Biophysical Society

High resolution X-ray emission spectroscopy of water and aqueous ions using the micro-jet technique

2010 ◽  
Vol 377 (1-3) ◽  
pp. 1-5 ◽  
Author(s):  
Kathrin M. Lange ◽  
René Könnecke ◽  
Samira Ghadimi ◽  
Ronny Golnak ◽  
Mikhail A. Soldatov ◽  
...  
Keyword(s):  
High Resolution ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Aqueous Ions

scholarly journals Sulfur Speciation in Biochars by Very High Resolution Benchtop Kα X-ray Emission Spectroscopy

2018 ◽  
Vol 122 (23) ◽  
pp. 5153-5161 ◽  
Author(s):  
William M. Holden ◽  
Gerald T. Seidler ◽  
Singfoong Cheah
Keyword(s):  
High Resolution ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Sulfur Speciation ◽  
Very High
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