Conductive Atomic Force Microscopy Investigation of Switching Thresholds in Titanium Dioxide Thin Films

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.5b01672 ◽

2015 ◽

Vol 119 (21) ◽

pp. 11958-11964 ◽

Author(s):

M. Trapatseli ◽

D. Carta ◽

A. Regoutz ◽

A. Khiat ◽

A. Serb ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Titanium Dioxide ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation ◽

Titanium Dioxide Thin Films

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Electron and Atomic Force Microscopy studies of photocatalytic titanium dioxide thin films deposited by DC magnetron sputtering

Thin Solid Films ◽

10.1016/j.tsf.2005.04.067 ◽

2005 ◽

Vol 490 (2) ◽

pp. 112-117 ◽

Author(s):

Dwight R. Acosta ◽

Arturo Martínez ◽

Carlos R. Magaña ◽

Jesús M. Ortega

Keyword(s):

Atomic Force Microscopy ◽

Titanium Dioxide ◽

Magnetron Sputtering ◽

Dc Magnetron Sputtering ◽

Force Microscopy ◽

Atomic Force ◽

Titanium Dioxide Thin Films

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First conductive atomic force microscopy investigation on the oxide-film removal mechanism by chloride fluxes in aluminum brazing

Scripta Materialia ◽

10.1016/j.scriptamat.2017.05.020 ◽

2017 ◽

Vol 138 ◽

pp. 12-16 ◽

Author(s):

Ziang Zhu ◽

Yiqing Chen ◽

Alan A. Luo ◽

Lihua Liu

Keyword(s):

Atomic Force Microscopy ◽

Removal Mechanism ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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Atomic force microscopy investigation of asymmetric diblock copolymer morphologies in thin films

European Polymer Journal ◽

10.1016/j.eurpolymj.2004.02.022 ◽

2004 ◽

Vol 40 (7) ◽

pp. 1371-1379 ◽

Author(s):

A Levent Demirel ◽

Mustafa Değirmenci ◽

Yusuf Yağcı

Keyword(s):

Atomic Force Microscopy ◽

Diblock Copolymer ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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Atomic force microscopy investigation of buckling patterns of nickel thin films on polycarbonate substrates

Philosophical Magazine Letters ◽

10.1080/09500830210154688 ◽

2002 ◽

Vol 82 (9) ◽

pp. 477-482 ◽

Author(s):

F. Cleymand ◽

C. Coupeau ◽

J. Grilhé

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nickel Thin Films ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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Atomic force microscopy study of titanium dioxide thin films grown by atomic layer epitaxy

Thin Solid Films ◽

10.1016/0040-6090(93)90557-6 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 32-35 ◽

Author(s):

Mikko Ritala ◽

Markku Leskelä ◽

Leena-Sisko Johansson ◽

Lauri Niinistö

Keyword(s):

Atomic Force Microscopy ◽

Titanium Dioxide ◽

Atomic Layer ◽

Microscopy Study ◽

Atomic Layer Epitaxy ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Titanium Dioxide Thin Films

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Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics

Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 - NanoScience and Technology ◽

10.1007/978-3-642-10497-8_23 ◽

2010 ◽

pp. 691-721 ◽

Author(s):

Christian Teichert ◽

Igor Beinik

Keyword(s):

Atomic Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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Atomic Force Microscopy Investigation of Ribonuclease A

Protein and Peptide Letters ◽

10.2174/0929866013409292 ◽

2001 ◽

Vol 8 (5) ◽

pp. 343-347 ◽

Author(s):

Luciano da Silva

Keyword(s):

Atomic Force Microscopy ◽

Ribonuclease A ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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Electron Transport in Thin Films of Polymer and Small-Molecule Acceptors Visualized by Conductive Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c03837 ◽

2021 ◽

Author(s):

Anjar Taufik Hidayat ◽

Hiroaki Benten ◽

Toshiki Kawanishi ◽

Noboru Ohta ◽

Azusa Muraoka ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electron Transport ◽

Small Molecule ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199608)24:8<503::aid-sia144>3.0.co;2-z ◽

1996 ◽

Vol 24 (8) ◽

pp. 503-510 ◽

Author(s):

C. M. Demanet ◽

K. Vijaya Sankar ◽

J. B. Malherbe

Keyword(s):

Atomic Force Microscopy ◽

Ion Bombardment ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation

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In situ atomic force microscopy investigation of the growth of secondary nuclei produced by contact of different growth faces of potash alum crystals under supersaturated solutions

Journal of Crystal Growth ◽

10.1016/s0022-0248(98)01137-3 ◽

1999 ◽

Vol 198-199 ◽

pp. 258-263 ◽

Author(s):

Manijeh M. Reyhani ◽

Sawsan Freij ◽

Gordon M. Parkinson

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force Microscopy Investigation ◽

Atomic Force ◽

Microscopy Investigation ◽

Supersaturated Solutions

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