First conductive atomic force microscopy investigation on the oxide-film removal mechanism by chloride fluxes in aluminum brazing

2017 ◽  
Vol 138 ◽  
pp. 12-16 ◽  
Author(s):  
Ziang Zhu ◽  
Yiqing Chen ◽  
Alan A. Luo ◽  
Lihua Liu
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