In situ atomic force microscopy investigation of the growth of secondary nuclei produced by contact of different growth faces of potash alum crystals under supersaturated solutions

Atomic Force ◽

Microscopy Investigation ◽

Supersaturated Solutions

In-situ atomic force microscopy investigation of aerosols exposed to different humidities

Fresenius Journal of Analytical Chemistry ◽

10.1007/s002160051340 ◽

1999 ◽

Vol 364 (4) ◽

pp. 296-304 ◽

Cited By ~ 21

Author(s):

G. Köllensperger ◽

G. Friedbacher ◽

R. Kotzick ◽

R. Niessner ◽

M. Grasserbauer

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

In Situ Atomic Force Microscopy Investigation of the {100} Face of KH2PO4in the Presence of Fe(III), Al(III), and Cr(III)

Langmuir ◽

10.1021/la049546f ◽

2004 ◽

Vol 20 (18) ◽

pp. 7643-7652 ◽

Cited By ~ 19

Author(s):

Tiffany N. Thomas ◽

Terry A. Land ◽

Jim J. DeYoreo ◽

William H. Casey

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

In situ atomic force microscopy investigation of copper behaviour and polypyrrole deposition from salicylate medium

Electrochimica Acta ◽

10.1016/j.electacta.2008.03.038 ◽

2008 ◽

Vol 53 (19) ◽

pp. 5783-5788 ◽

Cited By ~ 15

Author(s):

A.C. Cascalheira ◽

A.S. Viana ◽

L.M. Abrantes

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of Ribonuclease A

Protein and Peptide Letters ◽

10.2174/0929866013409292 ◽

2001 ◽

Vol 8 (5) ◽

pp. 343-347 ◽

Cited By ~ 2

Author(s):

Luciano da Silva

Keyword(s):

Atomic Force Microscopy ◽

Ribonuclease A ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of Ion-bombarded InP: Effect of Angle of Ion Bombardment

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199608)24:8<503::aid-sia144>3.0.co;2-z ◽

1996 ◽

Vol 24 (8) ◽

pp. 503-510 ◽

Cited By ~ 16

Author(s):

C. M. Demanet ◽

K. Vijaya Sankar ◽

J. B. Malherbe

Keyword(s):

Atomic Force Microscopy ◽

Ion Bombardment ◽

Force Microscopy ◽

Atomic Force ◽

Atomic force microscopy investigation of filled elastomers and comparison with transmission electron microscopy — application to silica-filled silicone elastomers

Polymer ◽

10.1016/s0032-3861(01)00058-1 ◽

2001 ◽

Vol 42 (14) ◽

pp. 6259-6270 ◽

Cited By ~ 33

Author(s):

F Clément ◽

A Lapra ◽

L Bokobza ◽

L Monnerie ◽

P Ménez

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Atomic Force Microscopy ◽

Silicone Elastomers ◽

Force Microscopy ◽

Filled Elastomers ◽

Atomic Force ◽

Transmission Electron ◽

Atomic force microscopy investigation of a step generation and bunching on the (100) facet of a CH3 NH3 PbI3 crystal, grown from γ-Butyrolactone

Crystal Research and Technology ◽

10.1002/crat.201700021 ◽

2017 ◽

Vol 52 (4) ◽

pp. 1700021 ◽

Cited By ~ 5

Author(s):

Jianxu Ding ◽

Ying Zhao ◽

Yingshuang Sun ◽

Songjie Du ◽

Hongzhi Cui ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Investigation ◽

Step Generation

Atomic Force Microscopy Investigation on Young’s Modulus of Cartilage for Osteoarthritis Study

Engineering Asset Management and Infrastructure Sustainability ◽

10.1007/978-0-85729-493-7_79 ◽

2012 ◽

pp. 1019-1025

Author(s):

M. Wang ◽

Z. Peng ◽

J. A. Watson ◽

G. S. Watson ◽

B. N. Morris ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Young’S Modulus ◽

Young's Modulus ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Investigation of the Contributions of Listeria monocytogenes Cell-Wall Biomacromolecules to Their Adherence and Mechanics

The Journal of Physical Chemistry B ◽

10.1021/acs.jpcb.0c04025 ◽

2020 ◽

Vol 124 (28) ◽

pp. 5872-5883

Author(s):

F. Pinar Gordesli-Duatepe ◽

Bong J. Park ◽

Leen H. Kawas ◽

Nehal I. Abu-Lail

Keyword(s):

Atomic Force Microscopy ◽

Cell Wall ◽

Listeria Monocytogenes ◽

Force Microscopy ◽

Atomic Force ◽

2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) ◽

Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron irradiated silicon detectors

10.1109/icmel.2000.840590 ◽

2002 ◽

Author(s):

G. Golan ◽

E. Rabinovich ◽

A. Inberg ◽

A. Axelevitch ◽

M. Oksman ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Deformation Characteristics ◽

Silicon Detectors ◽

Force Microscopy ◽

Atomic Force ◽