Theoretical Bounds on Electron Energy Filtering in Disordered Nanomaterials

Nano Letters ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 8441-8446
Author(s):  
Amro Dodin ◽  
Brian Aull ◽  
Roderick R. Kunz ◽  
Adam P. Willard
Keyword(s):  
Electron Energy ◽  
Energy Filtering ◽  
Electron Energy Filtering

scholarly journals Theoretical Bounds on Electron Energy Filtering in Disordered Nanomaterials

2019 ◽  
Author(s):  
Amro Dodin ◽  
Brian F. Aull ◽  
Roderick R. Kunz ◽  
Adam Willard
Keyword(s):  
Theoretical Model ◽  
Electron Energy ◽  
Energy Levels ◽  
Additional Source ◽  
Discrete Energy ◽  
Energy Filtering ◽  
Simple Theoretical Model ◽  
Particle Polydispersity ◽  
Electron Energy Filtering ◽  
Individual Nanoparticles

This manuscript presents a theoretical model for determining the electron energy filtering properties of nanocomposite materials. Individual nanoparticles can serve as energy filters for tunneling electrons due their discretized energy levels. Nanomaterials comprised of many individual nanoparticles can in principle serve the same purpose, however, particle polydispersity can lead to an additional source of energetic broadening. We describe a simple theoretical model that includes the effects of discrete energy levels and inhomogeneous broadening. We use this model to identify the material parameters needed for effective energy filtering by quantum dot solids.

scholarly journals Theoretical Bounds on Electron Energy Filtering in Disordered Nanomaterials

2019 ◽  
Author(s):  
Amro Dodin ◽  
Brian F. Aull ◽  
Roderick R. Kunz ◽  
Adam Willard
Keyword(s):  
Theoretical Model ◽  
Electron Energy ◽  
Energy Levels ◽  
Additional Source ◽  
Discrete Energy ◽  
Energy Filtering ◽  
Simple Theoretical Model ◽  
Particle Polydispersity ◽  
Electron Energy Filtering ◽  
Individual Nanoparticles

This manuscript presents a theoretical model for determining the electron energy filtering properties of nanocomposite materials. Individual nanoparticles can serve as energy filters for tunneling electrons due their discretized energy levels. Nanomaterials comprised of many individual nanoparticles can in principle serve the same purpose, however, particle polydispersity can lead to an additional source of energetic broadening. We describe a simple theoretical model that includes the effects of discrete energy levels and inhomogeneous broadening. We use this model to identify the material parameters needed for effective energy filtering by quantum dot solids.

Scanning Electron Diffraction Attachment with Energy Filter

1970 ◽  
Vol 28 ◽  
pp. 536-537
Author(s):  
L. F. Barden ◽  
J. Craig Gray
Keyword(s):  
Electron Diffraction ◽  
Energy Loss ◽  
Diffraction Pattern ◽  
Electron Energy ◽  
Electrostatic Energy ◽  
Energy Filtering ◽  
Transmission Electron ◽  
Electron Microscopes ◽  
Electron Energy Filtering ◽  
Scanning Electron

The advantages of scanning electron diffraction with electron energy filtering over conventional electron diffraction have been fairly widely described, and, more recently, the use of such systems in conjunction with transmission electron microscopes has been reported. By means of scanning diffraction, the electron intensities in a diffraction pattern may be measured and plotted directly on an XY recorder without the inaccuracy and inconvenience of the normal photographic-densitometric process; and the use of an energy filter to remove electrons that have suffered an energy loss allows direct measurement of the diffracted intensities of the elastically-scattered electrons. In this paper, we describe a Scanning Electron Diffraction Attachment (SEDA) with electrostatic energy filter that has been constructed for use with the AEI EM6 and EM8 series of electron microscopes.

Electron energy filtering significantly improves amplitude contrast of frozen-hydrated protein at 300kV

2006 ◽  
Vol 156 (3) ◽  
pp. 524-536 ◽  
Author(s):  
Koji Yonekura ◽  
Michael B. Braunfeld ◽  
Saori Maki-Yonekura ◽  
David A. Agard
Keyword(s):  
Electron Energy ◽  
Energy Filtering ◽  
Hydrated Protein ◽  
Electron Energy Filtering

Analysis of Diffraction Contrast as A Function of Energy Loss in Energy Filtering Transmission Electron Microscope (EFTEM) Imaging and Possible Implications on High-Resolution Compositional Mapping

1999 ◽  
Vol 5 (S2) ◽  
pp. 620-621
Author(s):  
K.T. Moore ◽  
J.M. Howe
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Diffraction Contrast ◽  
Energy Filtering ◽  
Background Removal ◽  
Transmission Electron ◽  
Important Relationship ◽  
Electron Energy Loss

The dependence of diffraction contrast on electron energy loss is an important relationship that needs to be understood because of its potential effect on energy-filtering transmission electron microscope (EFTEM) images. Often when either a two-window jump-ratio image or a three-window elemental map is produced diffraction contrast is not totally eliminated and contributes to the intensity of the final EFTEM image. Background removal procedures often are unable to completely account for intensity changes due to dynamical effects (i.e., elastic scattering) that occur between images acquired at different energy losses, leaving artifacts in the final EFTEM image.In this study, the relationship between diffraction contrast and electron energy loss was investigated by obtaining EFTEM images of a bend contour in aluminum in 100 eV increments from 0 to 1000 eV (Fig. 1). EFTEM images were acquired a JOEL 2010F FEG TEM with a Gatan imaging filter (GIF) at a microscope magnification of 8 kX using a 1 eV/pixel dispersion, 2X binning (512 x 512) and exposure times ranging from 0.25 s for 0 eV energy loss up to 132 sec for 1000 eV energy loss.

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