Nanoscale Characterization of Back Surfaces and Interfaces in Thin-Film Kesterite Solar Cells

2017 ◽  
Vol 9 (20) ◽  
pp. 17024-17033 ◽  
Author(s):  
Kasra Sardashti ◽  
Evgueni Chagarov ◽  
Priscilla D. Antunez ◽  
Talia S. Gershon ◽  
Scott T. Ueda ◽  
...  
2005 ◽  
Vol 865 ◽  
Author(s):  
Iver Lauermann ◽  
Paul Pistor ◽  
Immo Kötschau ◽  
Marcus Bär

AbstractIn this paper we describe synchrotron based, state-of-the-art spectroscopic methods for the analysis of surfaces and interfaces in thin film photovoltaic devices, their merits and their limitations. Using results obtained with the “CISSY” end station at the BESSY synchrotron in Berlin, Germany, we show how surface sensitive Synchrotron excitedX-rayPhotoelectronSpectroscopy(SXPS)andSoftX-rayEmissionSpectroscopy (SXES), which yields compositional and chemical depth information in the ten to hundred nm scale, have increased our knowledge of the chemistry of surfaces and buried interfaces of these systems.


2007 ◽  
Vol 37 (2) ◽  
pp. 145-151 ◽  
Author(s):  
Nazar Abbas Shah ◽  
Abid Ali ◽  
Asghari Maqsood
Keyword(s):  

2017 ◽  
Vol 5 (1) ◽  
pp. 1-7 ◽  
Author(s):  
Haruto Maruhashi ◽  
Takeo Oku ◽  
Atsushi Suzuki ◽  
Tsuyoshi Akiyama ◽  
Yasuhiro Yamasaki

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