Synchrotron-based spectroscopy for the characterization of surfaces and interfaces in chalcopyrite solar cells

In this paper we describe synchrotron based, state-of-the-art spectroscopic methods for the analysis of surfaces and interfaces in thin film photovoltaic devices, their merits and their limitations. Using results obtained with the “CISSY” end station at the BESSY synchrotron in Berlin, Germany, we show how surface sensitive Synchrotron excitedX-rayPhotoelectronSpectroscopy(SXPS)andSoftX-rayEmissionSpectroscopy (SXES), which yields compositional and chemical depth information in the ten to hundred nm scale, have increased our knowledge of the chemistry of surfaces and buried interfaces of these systems.