Atomic Layer Deposition of Zirconium Titanium Oxide from Titanium Isopropoxide and Zirconium Chloride

2001 ◽  
Vol 13 (5) ◽  
pp. 1528-1532 ◽  
Author(s):  
Antti Rahtu ◽  
Mikko Ritala ◽  
Markku Leskelä
Author(s):  
Benjamin Rich ◽  
Yael Etinger-Geller ◽  
G. Ciatto ◽  
A Katsman ◽  
Boaz Pokroy

Size effects and structural modifications in amorphous TiO2 films deposited by atomic layer deposition (ALD) were investigated. As with the previously investigated ALD-deposited Al2O3 system we found that the film’s...


2014 ◽  
Vol 118 (39) ◽  
pp. 22611-22619 ◽  
Author(s):  
Yu Lei ◽  
Bin Liu ◽  
Junling Lu ◽  
Joseph A. Libera ◽  
Jeffrey P. Greeley ◽  
...  

Nano Letters ◽  
2020 ◽  
Vol 20 (9) ◽  
pp. 6884-6890
Author(s):  
Wang Ke ◽  
Yang Liu ◽  
Xuelong Wang ◽  
Xiangdong Qin ◽  
Limei Chen ◽  
...  

2014 ◽  
Vol 5 ◽  
pp. 77-82 ◽  
Author(s):  
Massimo Tallarida ◽  
Chittaranjan Das ◽  
Dieter Schmeisser

We study the atomic layer deposition of TiO2 by means of X-ray absorption spectroscopy. The Ti precursor, titanium isopropoxide, was used in combination with H2O on Si/SiO2 substrates that were heated at 200 °C. The low growth rate (0.15 Å/cycle) and the in situ characterization permitted to follow changes in the electronic structure of TiO2 in the sub-nanometer range, which are influenced by quantum size effects. The modified electronic properties may play an important role in charge carrier transport and separation, and increase the efficiency of energy conversion systems.


2000 ◽  
Vol 6 (6) ◽  
pp. 303-310 ◽  
Author(s):  
K. Kukli ◽  
M. Ritala ◽  
M. Schuisky ◽  
M. Leskelä ◽  
T. Sajavaara ◽  
...  

2014 ◽  
Vol 118 (17) ◽  
pp. 8960-8970 ◽  
Author(s):  
Virginia R. Anderson ◽  
Noemi Leick ◽  
Joel W. Clancey ◽  
Katherine E. Hurst ◽  
Kim M. Jones ◽  
...  

2020 ◽  
Vol 56 (12) ◽  
pp. 1234-1241
Author(s):  
A. A. Malkov ◽  
Yu. A. Kukushkina ◽  
E. A. Sosnov ◽  
A. A. Malygin

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