Quantitative Characterization of Obliquely Deposited Substrates of Gold by Atomic Force Microscopy:  Influence of Substrate Topography on Anchoring of Liquid Crystals

1999 ◽  
Vol 11 (3) ◽  
pp. 612-623 ◽  
Author(s):  
Justin J. Skaife ◽  
Nicholas L. Abbott
Keyword(s):  
Atomic Force Microscopy ◽  
Liquid Crystals ◽  
Quantitative Characterization ◽  
Force Microscopy ◽  
Substrate Topography ◽  
Atomic Force ◽  
Influence Of Substrate

Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy

2015 ◽  
Vol 576 ◽  
pp. 81-87 ◽  
Author(s):  
H.L. Gao ◽  
X.W. Zhang ◽  
J.H. Meng ◽  
Z.G. Yin ◽  
L.Q. Zhang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Phase Separation ◽  
Polymer Solar Cells ◽  
Phase Image ◽  
Quantitative Characterization ◽  
Photoactive Layer ◽  
Force Microscopy ◽  
Atomic Force

Localization factor: A new parameter for the quantitative characterization of surface structure with atomic force microscopy (AFM)

Micron ◽  
2012 ◽  
Vol 43 (2-3) ◽  
pp. 305-310 ◽  
Author(s):  
Attila Bonyár ◽  
László Milán Molnár ◽  
Gábor Harsányi
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Quantitative Characterization ◽  
Force Microscopy ◽  
Localization Factor ◽  
Atomic Force

Quantitative characterization of single-cell adhesion properties by atomic force microscopy using protein-functionalized microbeads

2018 ◽  
Vol 32 (3) ◽  
pp. e2767 ◽  
Author(s):  
Lionel Chièze ◽  
Anthony Le Cigne ◽  
Marie Meunier ◽  
Alexandre Berquand ◽  
Stéphane Dedieu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Cell Adhesion ◽  
Single Cell ◽  
Quantitative Characterization ◽  
Adhesion Properties ◽  
Force Microscopy ◽  
Atomic Force

The quantitative characterization of the dispersion state of single-walled carbon nanotubes using Raman spectroscopy and atomic force microscopy

Carbon ◽  
2008 ◽  
Vol 46 (12) ◽  
pp. 1530-1534 ◽  
Author(s):  
Dokyung Yoon ◽  
Jae-Boong Choi ◽  
Chang-Soo Han ◽  
Young-Jin Kim ◽  
Seunghyun Baik
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
Single Walled Carbon Nanotubes ◽  
Quantitative Characterization ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dispersion State ◽  
Walled Carbon Nanotubes

Stereometric characterization of Dinizia excelsa Ducke wood from Amazon rainforest using atomic force microscopy

2021 ◽  
Author(s):  
Willian Silva Conceição ◽  
Ştefan Ţălu ◽  
Robert Saraiva Matos ◽  
Glenda Quaresma Ramos ◽  
Fidel Guereiro Zayas ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amazon Rainforest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dinizia Excelsa
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