Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution Based on the Maximum Entropy Method
2006 ◽
Vol 110
(13)
◽
pp. 6721-6731
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1993 ◽
Vol 26
(2)
◽
pp. 268-271
◽
Keyword(s):
Keyword(s):
1998 ◽
Vol 37
(Part 1, No. 7A)
◽
pp. 4124-4133
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