Atomic Force Microscopy and X-ray Photoelectron Spectroscopy Study of NO2 Reactions on CaCO3 (101̅4) Surfaces in Humid Environments

2012 ◽  
Vol 116 (36) ◽  
pp. 9001-9009 ◽  
Author(s):  
Jonas Baltrusaitis ◽  
Vicki H. Grassian
2010 ◽  
Vol 46 (3) ◽  
pp. 221-225 ◽  
Author(s):  
Yu. M. Nikolenko ◽  
V. G. Kuryavyi ◽  
I. V. Sheveleva ◽  
L. A. Zemskova ◽  
V. I. Sergienko

2018 ◽  
Vol 51 (2) ◽  
pp. 246-253
Author(s):  
Dev Raj Chopra ◽  
Justin Seth Pearson ◽  
Darius Durant ◽  
Ritesh Bhakta ◽  
Anil R. Chourasia

2013 ◽  
Vol 28 (2) ◽  
pp. 68-71 ◽  
Author(s):  
Thomas N. Blanton ◽  
Debasis Majumdar

In an effort to study an alternative approach to make graphene from graphene oxide (GO), exposure of GO to high-energy X-ray radiation has been performed. X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM) have been used to characterize GO before and after irradiation. Results indicate that GO exposed to high-energy radiation is converted to an amorphous carbon phase that is conductive.


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