Secondary Ion Mass Spectrometry of Poly(styrene-co-isoprene) Diblock Copolymers:  Improved Surface Sensitivity Using the High-Mass Region

2001 ◽  
Vol 34 (6) ◽  
pp. 1845-1854 ◽  
Author(s):  
John T. Mehl ◽  
David M. Hercules
Keyword(s):  
Mass Spectrometry ◽  
Diblock Copolymers ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Region ◽  
High Mass ◽  
Surface Sensitivity ◽  
High Mass Region ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Effect of Stereoregularity on TOF-SIMS Spectra of Polymers

1994 ◽  
Vol 48 (5) ◽  
pp. 620-622 ◽  
Author(s):  
Paul A. Zimmerman ◽  
David M. Hercules
Keyword(s):  
Mass Spectrometry ◽  
Methyl Methacrylate ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Mass Region ◽  
High Mass ◽  
Polypropylene Oxide ◽  
Tof Sims ◽  
Stereoregular Polymers ◽  
Secondary Ion

This study shows the utility of time-of-flight secondary ion mass spectrometry (TOF-SIMS) for the analysis of stereoregular polymers. It is possible to obtain distinctive spectra for polymers of different stereoregularity. The high mass region of the spectrum from 600 to 3000 Da is related to differences in polymer stereoregularity. Differences occur in the relative intensities and/or locations of clusters for polymers of different stereoregularities. Polymers studied include poly(methyl methacrylate), polypropylene, and polypropylene oxide. The extent of stereoregularity influences the degree of difference observed in the TOF-SIMS spectra.

Structure and Diffusion of Asymmetric Diblock Copolymers in Thin Films:  A Dynamic Secondary Ion Mass Spectrometry Study

1998 ◽  
Vol 31 (25) ◽  
pp. 8826-8830 ◽  
Author(s):  
Hideaki Yokoyama ◽  
Edward J. Kramer ◽  
Miriam H. Rafailovich ◽  
Jonathan Sokolov ◽  
Steven A. Schwarz
Keyword(s):  
Mass Spectrometry ◽  
Thin Films ◽  
Diblock Copolymers ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Spectrometry Study ◽  
Ion Mass Spectrometry ◽  
And Diffusion ◽  
Secondary Ion

High Mass Resolution Plasma Desorption and Secondary Ion Mass Spectrometry of Neutral Nickel Thiolate Complexes. Crystal Structure of [Ni6(SC3H7)12]

1992 ◽  
Vol 47 (7) ◽  
pp. 929-936 ◽  
Author(s):  
Herbert Feld ◽  
Angelika Leute ◽  
Derk Rading ◽  
Alfred Benninghoven ◽  
G. Henkel ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Metal Complexes ◽  
Secondary Ion Mass Spectrometry ◽  
Molecular Ions ◽  
Cluster Ions ◽  
High Mass ◽  
Plasma Desorption ◽  
Ion Mass Spectrometry ◽  
Thiolate Complexes ◽  
Secondary Ion

The use of mass spectrometry for the analysis of transition metal complexes is demonstrated by combined high resolution Plasma Desorption Mass Spectrometry (PDMS) and Secondary Ion Mass Spectrometry (SIMS) investigations of the neutral nickel thiolate complexes [Ni4(SC3H7)8] (1), [Ni4(SC6H11)8] (2), [Ni8(SCH2COOEt)16] (3) and [Ni6(SC3H7)12] (4). The positive spectra are dominated by three kinds of SI-species: (a) molecular ions, (b) fragment ions and (c) molecular ions with one or more substrate atoms attached. The negative spectra show mainly nickel sulfur cluster ions of the composition (NixSy)-. In contrast to many Fast Atom Bombardment (FAB) spectra of neutral metal complexes, SIMS and PDMS spectra provide molecular weight as well as fragment ion information. Both techniques are most powerful tools for the investigation of coordination compounds because the samples are easy to prepare and the spectra are independent of matrix conditions. Additionally crystallographic studies have been carried out for 4. The hexanuclear complex 4 with square planar Ni-S coordination sites crystallizes in the trigonal space group R 3̅ with Z = 3 and α = 18.537(5), c = 13.966(3) Å.

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