Relaxation in Thin Polymer Films Mapped across the Film Thickness by Astigmatic Single-Molecule Imaging

We present a hybrid nano-molecular system for optically activated, silver nanoparticle enhanced fluorescence in solution and in thin-polymer films, alongside single molecule level insights into the metal-enhanced fluorescence mechanism.

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Capillary Kinetics of Thin Polymer Films in Permeable Microcavities

MRS Proceedings ◽

10.1557/proc-1022-ii01-02 ◽

2007 ◽

Vol 1022 ◽

Author(s):

Kahp-Yang Suh

Keyword(s):

Experimental Data ◽

Film Thickness ◽

Satisfactory Agreement ◽

Polymer Films ◽

Capillary Rise ◽

Original Model ◽

Thin Polymer Films ◽

Modified Model ◽

Thin Polymer ◽

Kinetics Of

AbstractWe present a Poiseuille model that can explain the rate of capillary rise of thin polymer films in permeable microcavities. In comparison to the traditional Poiseuille formulation, two unique features of the system were considered: the permeable nature of the enclosure and the effect of thin polymer films that are confined to the substrate. The model predicts that the rate is inversely proportional to the channel width, contrary to what the original Poiseuille model predicts, and it is proportional to the initial film thickness, which the original model cannot account for. The modified model is in satisfactory agreement with experimental data.

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Characterization of Thin Polymer Films by X-ray Reflectometry with Synchrotron Radiation

Journal of Synchrotron Radiation ◽

10.1107/s0909049598006797 ◽

1998 ◽

Vol 5 (5) ◽

pp. 1304-1308 ◽

Cited By ~ 3

Author(s):

Keitaro Kago ◽

Hitoshi Endo ◽

Hideki Matsuoka ◽

Hitoshi Yamaoka ◽

Nozomu Hamaya ◽

...

Keyword(s):

Fourier Transform ◽

Synchrotron Radiation ◽

Film Thickness ◽

Polymer Films ◽

Curve Fitting ◽

Thin Polymer Films ◽

X Ray ◽

Fitting Procedure ◽

Thin Polymer

X-ray reflectivity (XR) measurements with a synchrotron radiation source were carried out for thin polymer films on a glass plate. From the XR data, the film thickness and surface and interface roughnesses could be determined. In addition, the appropriate conditions and precision for measurements were also discussed. Kiessig fringes were observed clearly for specular XR measurements of poly(methylmethacrylate) thin film. Analysis of the XR data allowed the determination of the film thickness very precisely. By a curve-fitting procedure of the XR profile, the film-surface roughness and film–substrate interface roughnesses were determined. A Fourier transform of the XR data was performed as an alternative method of evaluating the film thickness. The values for the film thickness obtained by the curve-fitting procedure and Fourier-transform procedure were slightly different from each other. One possibility for the cause of this difference may be an integral error and/or cut-off effect in the Fourier-transform procedure. The XR technique with synchrotron radiation is a very powerful tool for structural characterization of thin polymer films.

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